ALBERT

All Library Books, journals and Electronic Records Telegrafenberg

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    Electronic Resource
    Electronic Resource
    The process-controlled magnetic properties of nanostructured Co/Ag composite films : The 5th Joint MMM−Intermag Conference (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 70 (1991), S. 5882-5884 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Nanostructured Co/Ag composite films were prepared by magnetron sputtering using a single target. The average crystallite sizes of Co and Ag in the films depend on the deposition conditions. As the substrate temperature increases from 100 °C to 600 °C, the average Ag crystallite size increases from 39 to 452 A(ring), and the average Co crystallite size increases from 〈30 to 297 A(ring) in the film with 39 vol. % of Co. The films with 39 vol. % of Co and prepared at 400 °C substrate temperature showed a maximum magnetic coercivity of 565 Oe at 6 K. We have studied the correlation between the structure and magnetic properties of these films.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.350094
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    Sputtering pressure effect on microstructure of surface and interface, and on coercivity of Co/Pt multilayers : The 5th Joint MMM−Intermag Conference (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 70 (1991), S. 6044-6046 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Thin Co/Pt multilayers were prepared on Si and glass substrates by sputtering with Ar pressures ranging from 2.5 to 15 mTorr. The bilayer structure of the samples was Co(3 A(ring))/Pt(15 A(ring))×17, and all samples had the easy axis of magnetization perpendicular to the sample surface as determined with a SQUID magnetometer. All samples retained the layered structure, as revealed by low-angle x-ray diffraction. In addition, diffraction peaks due to the formation of Co-Pt compounds (presumably at the interfaces between Co and Pt) were identified. The coercivity of samples changed from about 400 Oe for films deposited at low Ar sputtering pressure (2.5 mTorr) to as high as 2300 Oe for films deposited at high Ar pressure (15 mTorr). Ellipsometry and atomic force microscopy were used to study surface roughness and microstructure of samples prepared at different sputtering pressures.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.350066
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    Modeling AlxGa1−xAs optical constants as functions of composition (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 68 (1990), S. 5925-5926 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Three models for the dielectric function εx(hν) of AlxGa1−xAs are reviewed. All are based on measured optical constants at discrete compositions. The validity of each model near critical point energies, and otherwise, is evaluated. Only the energy-shift model is appropriate over the entire available spectrum (1.5–6.0 eV), including the band-gap (E0) region.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.346921
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 4
    Electronic Resource
    Electronic Resource
    Ellipsometric analysis of computer disk structures (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 4878-4880 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have used variable angle spectroscopic ellipsometry (VASE) to analyze the materials surfaces and interfaces in multilayer sputtered media computer disks. Specifically, the system C/CoNiCr/Cr/NiP/Al has been investigated for layer thicknesses, interfacial and surface roughness, and radial and circumferential uniformity. By first characterizing the Cr/NiP/Al then CoNiCr/Cr/NiP/Al structures, we were able to fully characterize the complete disk structure. The interface width between the carbon layer and CoNiCr magnetic layer was determined to be approximately 260 A(ring). This is reasonable considering typical surface roughness present on magnetic disks, and that the carbon "fills'' in this surface roughness. VASE is a nondestructive technique and used at atmospheric pressure, and is thus suitable for use in a production environment.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.344765
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 5
    Electronic Resource
    Electronic Resource
    Enhancement of magneto-optical Kerr effects (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 5337-5339 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A general expression for the magneto-optical polar Kerr effect is given for a bilayered configuration in which the optical constants of the two media differ. The equation shows that a giant enhancement of the Kerr effect in magneto-optical/metallic bilayers can be expected if the dielectric constants of the two materials are low or are matched well to the other. An explicit equation is also given to calculate the spectral enhancement due to a dielectric overcoating on magnetic substrates. An example is given for SiO-coated Dy/Co compositionally modulated alloys, yielding a good comparison to the experimental results in both the transparent and absorbing spectral regions of SiO.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.344603
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 6
    Electronic Resource
    Electronic Resource
    Nanostructural effects and interface magnetism in Co/Pd multilayers : 37th Annual conference on magnetism and magnetic materials (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 5954-5956 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A series of Co/Pd multilayers were made by dc magnetron sputter deposition on Al foil substrates. For these multilayered samples, Co layer thicknesses were less than 4 A(ring) and Pd layers were varied from 4 to 22 A(ring). Sputtering rates were controlled by either sputtering power (10–50 W) or Ar sputtering pressure (3–15 mTorr). In both cases, lower deposition rates yielded higher perpendicular coercivity up to 2.6 kOe. Structures of the samples were studied using conventional θ-2θ x-ray diffractometry (XRD). It has been found that magnetic properties such as coercivity and saturation magnetization are sensitive to interfacial structures. A nanostructural model including interfacial parameters such as alloy layer composition is discussed and compared with the magnetization data. Both XRD and magnetization measurements show that the interfaces become more diffuse at higher sputtering pressures.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.353482
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 7
    Electronic Resource
    Electronic Resource
    Variable angle of incidence analysis of magneto-optic multilayers (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 4801-4802 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have applied the technique of variable angle of incidence spectroscopic ellipsometry (VASE) to the analysis of multilayered magneto-optic structures. With this instrument we measure the complete pseudodielectric tensor (diagonal and off-diagonal elements) for the sample of interest at variable angles of incidence. We have also developed computer software to perform a best-fit analysis of the measured data, providing optical constants, Voigt parameters, and layer thicknesses for the individual layers in the sample. Additionally, given an estimate of the material parameters, this software will provide an estimate of the optimum spectral range and angles of incidence for accurate characterization of the sample. An example of the above is given for a series of thicknesses of Dy/Co compositionally modulated multilayers deposited on a thick silver layer and subsequently overcoated with a thick layer of SiO. Results confirm the predicted optimum range of accuracy for this material system and effectively delineate the useful spectral range of this technique.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.344792
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 8
    Electronic Resource
    Electronic Resource
    Temperature dependence of optical properties of GaAs (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 70 (1991), S. 3261-3267 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Pseudodielectric functions 〈ε〉=〈ε1〉+i〈ε2〉 of GaAs were measured by spectroscopic ellipsometry (SE), in the range of 1.6–4.45 eV, at temperatures from room temperature (RT) to ∼610 °C. A very clean, smooth surface was obtained by first growing an epitaxial layer of GaAs on a GaAs substrate and immediately capping it with a protective layer of arsenic. The cap prevented surface oxidation during transport to the measurement chamber, where it was evaporated under ultrahigh vacuum at ∼350 °C. Room-temperature SE results from this surface are in good agreement with those in the literature obtained by wet-chemical etching. A quantitative analysis of the 〈ε〉 spectrum was made using the harmonic-oscillator approximation (HOA). It is shown by the HOA that the E1 and E1+Δ1 energy-band critical points shift downward ∼300 meV as temperature increases from RT to ∼610 °C. An algorithm was developed, using the measured optical constants at a number of fixed temperatures, to compute the dielectric function spectrum at an arbitrary temperature in the range of 22–610 °C. Therefore, the ellipsometer can be utilized as an optical thermometer to determine the sample surface temperature.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.349285
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 9
    Electronic Resource
    Electronic Resource
    Temperature and thickness dependence of coercivity and magnetization of Co/Cu and Co/Si multilayers : The 5th Joint MMM−Intermag Conference (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 70 (1991), S. 6050-6052 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Co/Cu and Co/Si multilayers of total thickness ∼3000 A(ring) were prepared by rf and dc magnetron sputtering. The nominal thicknesses of the individual layers were in the range of 4 to 100 A(ring). A large coercivity (Hc) at 10 K was observed for very thin layers of Co in Co/Cu samples, and it decreased with increase of the Co layer thickness. For very thin layers of Co in Co/Cu samples, the layer behaved superparamagnetically. Similar behavior was not to be observed in Co/Si samples. With increased substrate temperature (Ts) during deposition, Hc was also observed to increase (decrease) for Co/Cu (Co/Si) samples. Magnetization data were modeled to determine the diffusion layer thicknesses.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.350042
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 10
    Electronic Resource
    Electronic Resource
    Magneto-optic and optical characterization of Tb/Co compositionally modulated amorphous films : 35th annual conference on magnetism and magnetic materials (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 5989-5991 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Amorphous Tb/Co compositionally modulated films were deposited on Si substrates with different modulation layer thicknesses ranging from about 2.5 to 15 A(ring). The nominal Tb to Co layer thickness ratios were systematically varied and the complex refractive index (n and k) and polar magneto-optical Kerr effects (rotation and ellipticity) were measured in the 3000–8000-A(ring) spectral range as well. The samples were divided into two groups. In one group, the thickness of the Co layers was fixed, the Tb layer thickness varied. In the second group, the thickness of the Tb layer was fixed, and that of the Co layer thickness varied. The Kerr rotation and the coercivities of the samples showed very consistent and interesting changes. X-ray diffraction and x-ray fluorescence were also performed on the samples, which revealed layered structures, or compositional modulation, and provided information on the Tb to Co atomic ratios in the samples.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.347814
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...