ISSN:
1573-2746
Source:
Springer Online Journal Archives 1860-2000
Topics:
Chemistry and Pharmacology
,
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
Abstract 400 kV high resolution electron microscopy (HREM), deep level transient spectroscopy (DLTS) and steady state electrical measurements have been applied to ∑37(610) and ∑29(520) [001] tilt grain boundaries (GBs) in germanium bicrystals. The atomic boundary structures were revealed by experimental HREM images taken under different defocus conditions. Later, structure models were refined by means of a trial-and-error method applying alternatively the image simulation and the molecular static calculation of relaxed structures. The structures were shown to be consistent with the modified structural unit model. Although the structures are different for the two GBs studied, DLTS data and steady state measurements were found to be quite similar for both GBs. Thus, the results point to the extrinsic origin of localized deep states at the GBs. The analysis of DLTS spectra indicates the impurity segregation at the boundary, e.g., the formation of vacancy-type oxygen complexes of a donor-like state at E c-0.21 eV, which results in the fluctuation of the potential barrier. Defects in the GBs—like facets, atomic steps and secondary grain boundary dislocations—which are characteristic of both boundaries can act as nuclei to the impurity segregation.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00215168
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