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  • 1
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Zn1−xMnxSe films were grown by molecular-beam epitaxy on (100)-oriented GaAs, with Mn mole fraction varying from 0.06 to 0.22. All samples were characterized by x-ray diffraction. The Faraday rotations of Zn1−xMnxSe films was measured with polar Kerr apparatus in the 1.5–3.5 eV photon energy range at room temperature and 10 kG magnetic field. The Faraday spectra show two rotation peaks located at about 2.45 and 2.6 eV for all samples, and another peak located at about 2.74 eV appears for higher composition (x〉0.14) samples. The Mn2+ transitions shift toward the red with increasing Mn mole fraction. The Faraday rotations related to the interband transitions were not observed. The three Faraday rotations were due to the Mn2+ d–d* multiplet transitions: 6A1(6S)→4T2(4G) (∼2.45 eV); 6A1(6S)→4A1(4G) 4E(4G) (∼2.6 eV); and 6A1(6S)→4T1(4P) (∼2.72 eV), respectively. ©1997 American Institute of Physics.
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  • 2
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In Zn1−xMnxSe, Mn2+ d→d* transitions were found to induce giant Faraday rotation, and peaks of the Faraday rotation spectra were red-shifted linearly with increasing Mn composition. Through studying the magneto-optical transition variation with Mn composition, the Mn composition can be determined. Results from the Faraday rotation analysis were compared with the x-ray diffraction data and were found in good agreement with each other. © 1996 American Institute of Physics.
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  • 3
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The magneto-optical and optical properties of ultrathin Fe films sandwiched between Au layers were studied. A pronounced Kerr rotation peak is observed respectively in the photon energy range of 3.6–3.8 eV when the Fe layer is thinner than 1.5 nm, and in the range of 3.4–3.5 eV for thicker Fe layers. In simple calculations, the Kerr rotation peak is demonstrated to originate from the variation of the off-diagonal element in dielectric tensor of the Fe layers. The relative peak height Δθk, the normalized Kerr rotation θkn, and the effective optical constants at the photon energy of 3.5 eV are found to oscillate as a function of dFe. © 1996 American Institute of Physics.
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 3048-3051 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The crystallization of vacuum evaporated selenium on glass, indium tin oxide, and polycarbonate substrates held at 70 °C was investigated using a near infrared microscope and scanning electron microscopy. The crystallization, observed merely at the Se/substrate interface, was found greatly enhanced and the structure of the crystallites modified if the substrates are soaked in water prior to the selenium deposition. It is suggested that residual water molecules entrapped in the substrate act as additional nucleation sites and induce the crystallization of selenium. The morphology of the individual crystallite depends only on the type of substrate; it is not affected by water-soaking or by post-annealing of the Se films in air. For all surface compositions and treatments, no chemical bond was formed between the substrate and the selenium film as revealed by x-ray photoelectron spectroscopy. © 1995 American Institute of Physics.
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  • 5
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new type of incidence-angle-variable infrared spectroscopic ellipsometer working in the 2100–10 000 wave number range has been designed and constructed. For the system, the analyzer and polarizer were driven by two microstepping motors having hollow shafts and rotating synchronously with a speed ratio of 2:1, i.e., A=2P. The incidence angle can be varied from 30° to 90° with an accuracy of 0.01°. The doubled Fourier transforms as both functions of the wave number and the azimuthal angles of the polarizer and analyzer were carried out and integrated in the system. Two sets of ellipsometric parameters measured in the experiment have been used to test the data self-consistency of the system. In data reduction, the error arising from the slight anisotropy of the stray light was corrected. In application, the complex dielectric function of the Au film was measured with a data accuracy better that 1% in the entire spectral range. © 2000 American Institute of Physics.
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 85 (1999), S. 5118-5120 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A series of NixSiO2(1−x) granular films was prepared by ion sputtering, and some of them were annealed. Both the complex dielectric function and magneto-optical polar Kerr spectra of the samples were measured in the 1.5–4.5 eV photon energy range at room temperature. There are broad peaks in the 2.5–3.5 and 3.2–4.5 eV range in the Kerr rotation and ellipticity spectra, respectively. The Kerr intensities increase with increasing Ni composition. For sample x=0.65, the Kerr peaks are redshifted, with reduced intensities after annealing. Both the off-diagonal terms of the dielectric tensor and the optical constants are attributed to enhancement of the Kerr effect in a particular spectral range for the metal–insulator granular films. © 1999 American Institute of Physics.
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 85 (1999), S. 5121-5123 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A series of CoxAg100−x granular films was annealed at 100, 250, 400, and 500 °C, respectively. Both the dielectric function and polar Kerr effect were measured using a spectroscopic ellipsometer and a magneto-optical Kerr spectrometer in the 1.5–4.5 eV photon energy range. It was found that the Kerr effect was greatly enhanced with increasing annealing temperature, especially for those samples having low Co compositions. After annealing, the strong resonance peaks appear in the 3.7–4.1 eV range. For the typical sample with x=6, the maximum Kerr rotation angle is about 0.26° near 4.0 eV after annealing at 500 °C. Through data analysis, the large negative peak at about 3.85 eV is attributed to the plasma edge of Ag, and the positive peak near 4.0 eV is attributed to the new magneto-optical structure and the properties of the granular film. The larger short-wavelength Kerr effect will be useful for increasing magneto-optical data-storage density. © 1999 American Institute of Physics.
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 1744-1746 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Metal adhesion to polymers depends on the chemical structure at the interface. In the present work, we study the evaporation of Cr, Ti, and Au onto Teflon PFA (perfluoromethyl-vinyl-ether) substrates, and we modify the interface by post-deposition x-ray irradiation. In situ x-ray photoelectron spectroscopy shows that deposition of reactive metals such as Cr and Ti leads immediately to crosslinking and to the formation of carbide and fluoride species. Less reactive metals, such as Au, cause only small loss of fluorine without formation of any new species. The metal/PFA interface is strongly affected by x-ray irradiation in the case of Cr and Ti: remarkably enhanced crosslinking has been observed, which further increases with the metal coverage, while the carbides and fluorides remain basically unaffected. On the other hand, crosslinking increases only very slightly for pure PFA and for the Au/PFA interface, regardless of the Au thickness. These results suggest that radical recombination reactions are responsible for crosslinking at the interface between PFA and reactive metals.
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 7488-7491 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The magnetic and magneto-optical properties of Fe-Si/Pd multilayers prepared by rf sputtering were studied. For Fe-Si/Pd multilayers with a fixed Fe-Si layer thickness dm of 15 A(ring) and the Pd layer thickness dp increasing from 10.8 to 18 A(ring), the saturation magnetization Ms and the Kerr rotation θk decrease sharply and reach a minimum. With dp further increasing, the multilayers increase. Ms is almost constant and θk decreases slightly when dp(approximately-greater-than)36 A(ring). For Fe-Si/Pd (54 A(ring)) multilayers the room temperature Ms decreases and θk increases, respectively, with increasing dm. This is caused by the spin-polarization effect of Pd atoms near the interfaces.
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  • 10
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 67 (1995), S. 1665-1667 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present a formula which can be used to analyze the anisotropic and apparent Faraday effect occurring in a material having an optically anisotropic property. By using the formula the real Faraday parameter can be obtained. For example, we have used the formula to study the anisotropic Faraday effect of a single-crystal Cd0.55Mn0.45Te measured with the spectroscopic ellipsometer and rotating-analyzer-type Kerr apparatus. The calculated data were in good agreement with the experimental results. © 1995 American Institute of Physics.
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