ALBERT

All Library Books, journals and Electronic Records Telegrafenberg

feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 6859-6865 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The space dependence of charge carriers trapped in α-quartz under electron-beam bombardment is investigated using a Monte Carlo algorithm. The average energy of the electron after being detrapped from a trap site is first calculated by considering both the polar and nonpolar phonon scatterings. Later, the detrapping and trapping rates are also included in the model to obtain a stable trapped charge distribution, which is found to be dependent on the size as well as the temperature of the sample. Comparisons with experimental results of the size effect on the dielectric strength obtained from a scanning electron microscope are also made.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 1944-1948 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A scanning electron microscope is employed for the investigation of charging on different cuts of an α-SiO2. A method for the determination of trapped charges is proposed. Charging on different cuts is observed to decrease in the order of z cut, 30° cut, 45° cut, and 60° cut of the α-SiO2. This phenomenon is related to permittivity, defect density, and stress of the samples. Details of the experiments and the method of charge determination are given.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 1960-1967 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Using the scanning electron microscope we have investigated the physical parameters determining the size effect of various dielectric samples submitted to a surface electric field. It is shown that the size effect is a function of the static permittivity and of the space charge distribution. The results are explained by the consideration of charge diffusion and polarization relaxation processes resulting from the space charge formation. A one-dimensional mathematical model has also been used to describe space charge distribution. The findings were consistent with the experimental observations.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 1250-1255 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A scanning electron microscope is used as a tool to study dielectric relaxation processes in α-SiO2 by measuring the leakage current in the sample surrounded by a metallic aperture. A transient time (tt) of the order of a few seconds appears before the steady-state current is established. The time dependence of the trapping rate is found to follow a power law and to be related to relaxation processes of a dielectric under electrical and thermal stress.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 3263-3267 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Most phenomenological aspects of energy storage and release in dielectric materials caused by the charge trapping mechanism have recently been rationalized using the space charge model. We studied dynamical aspects by performing molecular dynamics simulations. We show that an excess electron introduced into the sapphire lattice (α-Al2O3) can be trapped only at a limited number of sites. The energy gained by allowing the electron to localize in these sites is of the order of 4–5 eV, agreeing well with the results of the space charge model. Displacements of the neighboring ions due to the implanted charge are shown to be localized in a small region of about 5 Å. Detrapping is observed at 250 K. The ionic displacements turn out to play an important role in modifying the potential landscape by dynamically lowering the barriers that cause localization at low temperatures. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 6
    ISSN: 1520-6904
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 7
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 72 (1998), S. 317-319 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The variation of the relative permittivity of charged dielectrics with trapped charge density has been investigated by a time-resolved current method, in conjunction with a mirror image method employing a scanning electron microscope. The calculation is made by a mathematical expression derived from classical electromagnetic theory. It is found that the relative permittivity of the charged area in the polymethylmethacrylate sample increases with the trapped charge density and saturates at a certain value of the trapped charge density. These observations have been discussed by analogy with the dielectric saturation occurring at a high applied external electric field. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 8
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 110 (1999), S. 4471-4476 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The formation free energy of clusters in a supersaturated vapor is obtained by a constrained Monte Carlo technique. A key feature of this approach is to set an upper limit to the size of cluster. This maximum cluster size serves essentially as an extra thermodynamic variable that constrains the system. As a result, clusters larger than the critical cluster of nucleation in the supersaturated vapor can no longer grow beyond the limiting size. Like changing the overall density of the system, changing the maximum cluster size also results in a different supersaturation and thereby a different formation free energy. However, at the same supersaturation and temperature it is found that the formation free energy has a unique value, independent of the upper limit of cluster size. The predicted size of critical cluster of nucleation is found to be consistent with the nucleation theorem as well as previous results using different simulation approaches. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 9
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 108 (1998), S. 4683-4684 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Monte Carlo simulation method is used to calculate the Helmholtz free energies of liquid cluster with boundary fixed in laboratory frame and a fluctuating center-of-mass (CM) and with a fixed boundary centered on a fixed CM. The former type of cluster is called drop conventionally and the latter type is the so-called Lee–Barker–Abraham (LBA) cluster. The free energy difference between the drop and the LBA cluster characterizes the free energy contribution due to the CM fluctuation. The simulation result is close to the theoretical estimate of Reiss, Katz, and Cohen than that of Abraham and co-workers. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 10
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 112 (2000), S. 294-300 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: A small-system grand canonical ensemble Monte Carlo method is developed to evaluate cluster size distribution and barrier to the nucleation in a supersaturated Lennard-Jones vapor. The theoretical foundation is a physical cluster theory in which the Stillinger cluster is used as a prototypical physical cluster. Using method of Mayer's cluster expansion, the cluster–vapor interaction is effectively taken into account. From a separate canonical ensemble Monte Carlo simulation using a test particle method, the averaged volume of the cluster is obtained and is also incorporated in the small-system ensemble simulation. By this implementation our simulation is computationally more efficient compared to that based on the n/v Stillinger cluster theory in that instead of searching the saddle point on a two-dimensional free energy surface (a function of cluster size n and volume v) one needs only to find the peak on a free energy curve (a function of n only). A comparison with the height of barrier obtained from a large-system ensemble Monte Carlo simulation [K. Oh and X. C. Zeng, J. Chem. Phys. 110, 4471 (1999)] shows that omission of the vapor–cluster attraction can cause an overestimation of the height by several kBT. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...