Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
60 (1989), S. 2945-2948
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A high-resolution LEED system with optimum operating parameters for use below 100 eV has been designed and tested. A field-emission-based electron gun with an angular divergence of 2 mrad, and a large sample detector distance of 150 mm provide the major improvements in resolution. Measured beam widths (Δk/2π FWHM) for both specular and nonspecular beams are approximately 0.002 A(ring)−1 in the energy range of 50–100 eV.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1140632
Permalink
|
Location |
Call Number |
Expected |
Availability |