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A high-resolution low-energy electron diffraction instrument (1989)

Hwang, Robert Q. ; Williams, Ellen D. ; Park, Robert L.

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 60 (1989), S. 2945-2948

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: A high-resolution LEED system with optimum operating parameters for use below 100 eV has been designed and tested. A field-emission-based electron gun with an angular divergence of 2 mrad, and a large sample detector distance of 150 mm provide the major improvements in resolution. Measured beam widths (Δk/2π FWHM) for both specular and nonspecular beams are approximately 0.002 A(ring)−1 in the energy range of 50–100 eV.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1140632

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