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  • 1
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    Foam viscometer (1960)
    Institute of Physics
    Details
    Publication Date: 1960-08-01
    Print ISSN: 0950-7671
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Published by Institute of Physics
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    PAPER CURRENT
  • 2
    Electronic Resource
    Electronic Resource
    Parametric tip model and force–distance relation for Hamaker constant determination from atomic force microscopy (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 80 (1996), S. 6081-6090 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Hamaker constants and dispersion forces interactions of materials are of increasing interest and the advent of atomic force microscopy (AFM) force measurements represents a new opportunity for quantitative studies of these interactions. A critical problem is the determination of a force–distance relation for realistic AFM probes. Due to the inadequacies of existing power-law sphere–plane models to describe the probe–sample system, we present a new parametric tip force–distance relation (PT/FDR). A surface integration method is developed to compute the interactions between arbitrarily shaped bodies. The method is based on the Hamaker pairwise integration in a continuous fashion, reducing the six-dimensional integration to a four-dimensional scheme. With this method, the PT/FDR is obtained and a nonlinear fitting routine is used to extract the model parameters and the Hamaker constant from AFM force–distance data. From the sensitivity analysis of the fitting of synthesized AFM force–distance data, one finds that, for large tip radius (compared to separation), the force is proportional to the product of the Hamaker constant and tip radius. Unique determination of the Hamaker constant can be achieved if a small radius tip is used in the AFM scan. By fitting to literature data, the effectiveness of the PT/FDR is shown. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.363680
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  • 3
    Electronic Resource
    Electronic Resource
    Diagnostics on Z (invited) : Papers from the thirteenth topical conference on high temperature plasma diagnostics (2001)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 72 (2001), S. 1167-1172 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The 100 ns, 20 MA pinch-driver Z is surrounded by an extensive set of diagnostics. There are nine radial lines of sight set at 12° above horizontal and each of these may be equipped with up to five diagnostic ports. Instruments routinely fielded viewing the pinch from the side with these ports include x-ray diode arrays, photoconducting detector arrays, bolometers, transmission grating spectrometers, time-resolved x-ray pinhole cameras, x-ray crystal spectrometers, calorimeters, silicon photodiodes, and neutron detectors. A diagnostic package fielded on axis for viewing internal pinch radiation consists of nine lines of sight. This package accommodates virtually the same diagnostics as the radial ports. Other diagnostics not fielded on the axial or radial ports include current B-dot monitors, filtered x-ray scintillators coupled by fiber optics to streak cameras, streaked visible spectroscopy, velocity interferometric system for any reflector, bremsstrahlung cameras, and active shock breakout measurement of hohlraum temperature. The data acquisition system is capable of recording up to 500 channels and the data from each shot is available on the Internet. A major new diagnostic presently under construction is the BEAMLET backlighter. We will briefly describe each of these diagnostics and present some of the highest-quality data from them. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1322618
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  • 4
    Electronic Resource
    Electronic Resource
    Room-temperature optical absorption in undoped α-Al2O3 (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 7542-7546 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Optical absorption over a large dynamic range obtained by two different experimental techniques is reported for an undoped α-Al2 O3 single crystal. Absorption data are presented in two energy ranges: 0.94–3.5 eV and 4.5–8.6 eV. Vacuum ultraviolet (vuv) absorption measurements were performed on three boules of Czochralski-grown single-crystal Al2 O3 with differing starting material purities. The initial powder purities were 99.99%, 99.999%, and 99.999999%. In addition to the vuv measurements, calorimetric absorption results obtained in the visible and near-infrared (ir) are presented. An empirical formula is obtained that provides an estimate of the absorption coefficient from the near-ir to the vuv for undoped Al2 O3 . Detailed impurity analyses and sample histories are given for the optical-quality α-Al2 O3 utilized herein.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.345817
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  • 5
    Electronic Resource
    Electronic Resource
    Optical absorption in undoped yttrium aluminum garnet (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 68 (1990), S. 1200-1204 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Room-temperature optical absorption over a large dynamic range is reported for single- crystal undoped yttrium aluminum garnet (Y3Al5O12 or YAG). Absorption results are presented for the energy ranges 1.8 to 3.0 and 4.5 to 6.5 eV. For this work, ultraviolet (UV) absorption measurements were performed on four different boules of Czochralski-grown undoped YAG. Absorption features were observed at 4.8 and 5.6 eV which can be attributed, at least in part, to trace impurity concentrations. Along with the UV measurements, calorimetric absorption results are presented at several laser wavelengths in the visible and near infrared (IR). The calorimetric results suggest a value of 1.5×10−3 cm−1 for the absorption coefficient of undoped YAG in the red and near IR. From the combination of UV and calorimetric measurements, an empirical estimate of the absorption coefficient from the visible to the UV is presented for undoped YAG. In addition to the absorption spectra, detailed chemical analyses and sample histories are given for the as-grown optical quality YAG utilized herein.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.346717
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  • 6
    Electronic Resource
    Electronic Resource
    Cu deposition on Al2O3 and AlN surfaces: Electronic structure and bonding (1987)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 62 (1987), S. 2286-2289 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report a photoelectron spectroscopy study of the interaction of copper with Al2O3 and AlN model systems processed under ultrahigh vacuum conditions and compared the intrinsic electronic interactions between the two cases. The evolution of the electronic structure and bonding of Cu to AlN has been further studied using ab initio total energy pseudofunction techniques.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.339485
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  • 7
    Electronic Resource
    Electronic Resource
    Optical reflectivity measurements using a laser plasma light source (1989)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 55 (1989), S. 1955-1957 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Light produced by a laser plasma light source (LPLS) is used to perform optical reflectivity measurements on single crystals from 5 to 40 eV in a single experiment. The intense continuum generated by the rare-earth plasma allows a significantly higher resolution above 15 eV and extends the measurements to higher energies than those attainable with other laboratory based light sources. This is the first application of a LPLS to vacuum ultraviolet spectroscopy of solids and we demonstrate this capability on two insulating materials, α-Al2O3 and MgAl2O4.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.102335
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  • 8
    Electronic Resource
    Electronic Resource
    Optical superlattices—a strategy for designing phase-shift masks for photolithography at 248 and 193 nm: Application to AlN/CrN (1997)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 70 (1997), S. 2371-2373 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This letter illustrates with AlN/CrN multilayers that optical superlattices, comprised of multilayers of a uv transmitting dielectric layer and a metallic layer, offer a systematic approach to design and fabricate partially transmitting, phase-shift masks for photolithography. From the measured optical constants of sputtered AlN/CrN multilayers, it was found that films had π-phase shift and tunable optical transmission between 5% and 15% at 365, 248, and 193 nm. We compared the optical properties of sputtered AlN/CrN multilayers to "ideal" superlattices, calculated from the measured optical properties of individual thick CrN and AlN layers, and to compositionally equivalent psuedobinary alloys of (AlN)1−x(CrN)x. Although optical properties for all three systems were nearly the same, which is attractive because it implies wide process lattitude, we found systematic differences that were attributed to their individual structures. A phase shift mask with 6% transmission at 365 nm was fabricated with a 1650-Å-thick (25 Å AlN+25 Å CrN) multilayer film. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.118876
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  • 9
    Electronic Resource
    Electronic Resource
    Electronic structure of aluminum nitride: Theory and experiment (1993)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 63 (1993), S. 1182-1184 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report the results of a vacuum ultraviolet (VUV) study of single crystal and polycrystalline AlN over the range 4–40 eV and compare these with theoretical optical properties calculated from first principles using an orthogonalized linear combination of atomic orbitals in the local density approximation. The electronic structure of AlN has a two-dimensional (2D) character indicated by logarithmic divergences at 8.7 and 14 eV. These mark the centers of two sets of 2D critical points which are associated with N 2p→Al 3s transitions and Al=N→Al 3p transitions, respectively. A third feature is centered at 33 eV and associated with N 2s→Al 3d transitions.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.109764
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  • 10
    Electronic Resource
    Electronic Resource
    THE DIAMOND-BACK MOTH OUTBREAK OF 1958 (1960)
    Oxford, UK : Blackwell Publishing Ltd
    Plant pathology 9 (1960), S. 0 
    Details
    ISSN: 1365-3059
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, Nutrition
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1365-3059.1960.tb01156.x
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