ISSN:
0142-2421
Keywords:
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
Auger electron signals from bulk samples of Si, Cu, Ag and W have been measured using three different machines (V.G. HB50, MA500 and ESCALAB), as a function of primary beam energy E0 (3-30 keV) and angle of incidence θ0 (0-80°). Relative peak-height data are compared with the calculations of cross-sections and back-scattering correction factors presented in Paper I of this series, and with other data and calculations in the literature. The relative cross-sections agree with experiment within 5% for Si-K and Ag M5, whereas this agreement worsens to 20% for Cu L3 and W M5. Angular-dependent experiments reflect the machine geometries and back-scattering. Values of back-scattering factors R(θ0) for Si K and W M5 relative to Cu L3 are in good agreement with transport equation calculations. Absolute (peak area) Auger yields have been analysed for one machine, leading to a common effective detector sensitivity (0.35 ± 0.03) for the three elements Si, Cu and Ag.
Additional Material:
7 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/sia.740141105
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