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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 2136-2146 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The variable spacing parallel plate resonator (VSPPR) is a microwave transmission line resonator with a continuously variable thickness of the dielectric spacer between the superconducting or metallic plates, filled by cryogenic liquid or vacuum. We measure the dielectric spacer thickness dependencies of the resonator frequency and quality factor, and fit them to theoretical forms, in order to extract the absolute values of penetration depth, λ, and surface resistance, Rs. A cryogenic micropositioning setup is developed to vary the spacer thickness from 0 to 100 μm with a resolution of 8.5 nm, and to maintain parallelism of the resonator plates. Measurement of ac capacitance between the plates is utilized to directly determine the separation between the resonator plates and to reduce the effect of their tilt and nonflatness on the accuracy of the measured Rs and λ. Because the operating temperature is fixed (77 K), the result for a superconductor is independent of an a priori model for the penetration depth versus temperature. This technique can also be employed as a surface impedance standard for characterization of high temperature superconducting films for microwave applications. © 2000 American Institute of Physics.
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 2082-2090 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We present a new technique to measure the complex surface impedance of the mixed state of superconducting thin films over the broad frequency range 45 MHz–20 GHz. The surface impedance is extracted from measurements of the complex reflection coefficient made on the film using a vector network analyzer. The technique takes advantage of a special geometry in which the self-fields from currents flowing in the film are everywhere parallel to the film surface, making it an ideal configuration in which to study vortex dynamics in superconductors. The broadband nature of the measurement system allows us to explore a region of magnetic field–temperature–frequency parameter space of superconductors previously inaccessible with other measurement techniques. The power of the technique is illustrated by measurements on thin films of the high temperature superconductor YBa2Cu3O7−δ.
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 84 (1998), S. 3392-3402 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Precise microwave measurements of sample conductivity, dielectric, and magnetic properties are routinely performed with cavity perturbation measurements. These methods require the accurate determination of quality factor and resonant frequency of microwave resonators. Seven different methods to determine the resonant frequency and quality factor from complex transmission coefficient data are discussed and compared to find which is most accurate and precise when tested using identical data. We find that the nonlinear least-squares fit to the phase versus frequency is the most accurate and precise when the signal-to-noise ratio is greater than 65. For noisier data, the nonlinear least-squares fit to a Lorentzian curve is more accurate and precise. The results are general and can be applied to the analysis of many kinds of resonant phenomena. © 1998 American Institute of Physics.
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 2751-2758 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe the use of a near-field scanning microwave microscope to image the permittivity and tunability of bulk and thin film dielectric samples on a length scale of about 1 μm. The microscope is sensitive to the linear permittivity, as well as to nonlinear dielectric terms, which can be measured as a function of an applied electric field. We introduce a versatile finite element model for the system, which allows quantitative results to be obtained. We demonstrate use of the microscope at 7.2 GHz with a 370 nm thick Ba0.6Sr0.4TiO3 thin film on a LaAlO3 substrate. This technique is nondestructive and has broadband (0.1–50 GHz) capability. The sensitivity of the microscope to changes in permittivity is Δεr=2 at εr=500, while the nonlinear dielectric tunability sensitivity is Δε113=10−3 (kV/cm)−1. © 2000 American Institute of Physics.
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 69 (1998), S. 3410-3417 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have developed a method to measure the electric field standing wave distributions in a microwave resonator using a scanned perturbation technique. Fast and reliable solutions to the Helmholtz equation (and to the Schrödinger equation for two-dimensional systems) with arbitrarily shaped boundaries are obtained. We use a pin perturbation to image primarily the microwave electric field amplitude, and we demonstrate the ability to image broken time-reversal symmetry standing wave patterns produced with a magnetized ferrite in the cavity. The whole cavity, including areas very close to the walls, can be imaged using this technique with high spatial resolution over a broad range of frequencies. © 1998 American Institute of Physics.
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 2314-2321 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have used a near-field scanning microwave microscope to image domain structure and quantitatively measure dielectric permittivity and nonlinearity in ferroelectric crystals at 8.1 GHz with a spatial resolution of 1 μm. We imaged ferroelectric domains in periodically poled LiNbO3, BaTiO3, and deuterated triglycine sulfate (DTGS) with a signal-to-noise ratio of 7. Measurement of the permittivity and nonlinearity of DTGS in the temperature range 300–400 K shows a peak at the Curie temperature, TC(approximate)340 K, as well as reasonable agreement with thermodynamic theory. In addition, the domain growth relaxation time shows a minimum near TC. We observe coarsening of ferroelectric domains in DTGS after a temperature quench from 360 to 330 K and evaluate the structure factor. © 2001 American Institute of Physics.
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  • 7
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have utilized the superconducting microstrip resonator technique to measure the magnetic penetration depth in high Tc oxide thin films in the 1–25 GHz regime. This technique is particularly well suited for thin films, where the absolute value of the penetration depth can be accurately determined. Results for high Tc superconducting thin films show that the value of the penetration depth is sensitive to the preparation conditions of the film, and the temperature dependence is that expected of conventional superconductors.
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  • 8
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 4404-4406 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We describe a scanning near-field microwave microscope which uses a loop probe to measure local magnetic properties of metallic samples on a length scale of 200 μm. We demonstrate imaging at 6 GHz through spatiallyresolved ferromagnetic resonance experiments on a single crystal of the colossal magneto-resistive material La0.8Sr0.2MnO3. We find the experimental results are qualitatively and quantitatively well described by a simple model of the system. © 2000 American Institute of Physics.
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  • 9
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 73 (1998), S. 2491-2493 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We describe the use of a cryogenic near-field scanning microwave microscope to image microwave electric fields from superconducting and normal-metal microstrip resonators. The microscope employs an open-ended coaxial probe and operates from 77 to 300 K in the 0.01–20 GHz frequency range with a spatial resolution of about 200 μm. We describe the operation of the system and present microwave images of Cu and Tl2Ba2CaCu2O8 microstrip resonators, showing standing wave patterns at the fundamental and second harmonic frequencies. © 1998 American Institute of Physics.
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  • 10
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 72 (1998), S. 861-863 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We describe quantitative imaging of the sheet resistance of metallic thin films by monitoring frequency shift and quality factor in a resonant scanning near-field microwave microscope. This technique allows fast acquisition of images at approximately 10 ms per pixel over a frequency range from 0.1 to 50 GHz. In its current configuration, the system can resolve changes in sheet resistance as small as 0.6 Ω/(square, open) for 100 Ω/(square, open) films. We demonstrate its use at 7.5 GHz by generating a quantitative sheet resistance image of a YBa2Cu3O7−δ thin film on a 5 cm diam sapphire wafer. © 1998 American Institute of Physics.
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