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  • 11
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 4469-4469 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Compositionally modulated multilayer samples of Fe/Ni have been prepared in a dual-ion-beam sputtering system in which one beam is used to deposit the film and the other is directed at the substrate to increase the surface mobility of the arriving atoms. The multilayers had equal thicknesses of Fe and Ni, and wavelengths λ varying between 15 and 120 A(ring). The composition modulation was investigated by measuring the satellite intensities. The phases present have been studied by x-ray diffraction and extended x-ray-absorption fine-structure measurements. The x-ray investigations included Read photographs. The Ni layers have fcc structure. For λ=120 A(ring) the Fe layers primarily have the usual structure of Fe, namely bcc. For λ〈40 A(ring) the Fe layers have fcc structure. For λ=50 A(ring) the Fe layers are a mixture of fcc and bcc phases. The magnetic properties have been investigated by vibrating-sample-magnetometer measurements. For λ=35 A(ring), T=298 K, and the magnetic field parallel to the substrate, the coercive force is only a few gauss and, of more importance, the saturation magnetization is approximately the sum of the magnetization expected for bcc Fe and fcc Ni. For λ=35 A(ring), T=298 K, and the magnetic field perpendicular to the substrate, a field of 20 kOe is required to achieve saturation.
    Type of Medium: Electronic Resource
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  • 12
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Thin-film specimens of amorphous Co74Fe6B15Si5 were subjected to heat-treatment procedures followed by room-temperature magnetic and structural characterization in an effort to quantitatively correlate magnetic property changes to local atomic structure. Fourier transforms of electron-yield extended x-ray-absorption fine structure spectra show second and higher atomic shell ordering about transition-metal ions to occur at Tann≈300 °C. This ordering evolves to a body-centered atomic structure with heat treatments at higher temperatures. Accompanying this structural evolution is an expansion of the nearest-neighbor distance, disruption of the spin-wave-resonance spectra, and general deterioration of the soft magnetic properties.
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  • 13
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 62 (1991), S. 982-985 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Small alignment errors of right-angle linkage monochromators typical to many x-ray absorption fine structure beamlines can cause significant errors in the energy calibrations. A 1° misalignment produces errors greater than 1 keV over the hard x-ray operating range of a typical monochromator. The energy error caused by such misalignments is analyzed and its mathematical form given. The error can be corrected by inverting the expression and the amount of misalignment determined by accurate energy measurements at a few points. The accuracy of the corrections is tested. The effects of this error on x-ray absorption fine structure data and their interpretation are also discussed.
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  • 14
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 5248-5250 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have investigated the effect of Co(Cr) substitution on magnetic properties of as-deposited Fe–Hf–N films. 4πMs increases with increasing Co content (3–16 at. %) and decreases with increasing Cr content. The film Fe56Co16Hf10N18(at. %) shows excellent soft magnetic properties, with 4πMs∼16.8 kG, Hc∼0.25 Oe, and effective permeability ∼4200 at 100 MHz. In Fe71Cr3Hf9N17, the permeability is about 5200 at 100 MHz, while the values of 4πMs and Hc are ∼14.6 kG and 0.5 Oe, respectively. In order to estimate the magnetic anisotropy, the angular dependency of the resonance magnetic field and linewidth were observed by ferromagnetic resonance (FMR) at 9.84 GHz. The Fe56Co16Hf10N18 film shows a single resonance peak, whereas the as-deposited Fe–Hf–N films shows weak secondary peaks. © 2000 American Institute of Physics.
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  • 15
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 3379-3380 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: In this report we consider the use of the program SHADOW for ray tracing different configurations of the PNC-CAT mircrofocus beamline. The emphasis is on the final design, which will include crystal and grazing incidence optics focusing onto the entrance of a long tapered glass capillary whose outlet diameter is of the order of one micron or less. The ray-tracing program has been especially valuable in comparing different configurations, determining the required stability of components, and optimizing the capillary profile. It has also been useful in evaluating the results of actual measurements on the throughput of long tapered capillaries fabricated of silica glass. Suggestions for improvements to SHADOW are given. We also present results of a compact pc-based capillary ray-tracing program for comparison. It allows us to use different profiles with minimal programming effort. © 1996 American Institute of Physics.
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  • 16
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 6151-6156 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Perovskite La1−xCaxMnO3−δ thin films were deposited on MgO(001) substrates using pulsed laser deposition. Effects of deposition conditions, such as laser fluence, substrate temperature, and oxygen pressure, on growth behaviors of the films were investigated over a wide range. Epitaxial La0.7Ca0.3MnO3−δ /MgO thin films were able to be grown in situ under conditions such as 1.5–2.1 J/cm2 laser fluence, 650–750 °C substrate temperature, and 100–300 mTorr oxygen pressure. The oxygen pressure during the deposition is found to be closely related to crystalline orientations of the films. Rutherford backscattering spectroscopy measurements show that the epitaxial La1−xCaxMnO3−δ thin films have compositions similar to those of targets, demonstrating that pulsed laser deposition is a useful technique to get thin films with complicated chemical compositions. The magnetoresistance, −ΔR(6T)/R(0), of the La0.7Ca0.3MnO3−δ /MgO thin film was about −80%, which is smaller than the reported values (i.e., ∼−99.92%) of the La–Ca–Mn–O thin films on LaAlO3 substrates [S. Jin, T. H. Tiefel, M. McCormack, R. A. Fastnacht, R. Ramesh, and L. H. Chen, Science 264, 413 (1994)]. © 1995 American Institute of Physics.
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  • 17
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of organic chemistry 39 (1974), S. 3763-3767 
    ISSN: 1520-6904
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
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  • 18
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of organic chemistry 40 (1975), S. 1348-1349 
    ISSN: 1520-6904
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
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  • 19
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 66 (1995), S. 3120-3122 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Epitaxial and preferentially oriented Bi4Ti3O12 thin films were grown using pulsed laser deposition on LaAlO3(001) and Al2O3(0001) substrates, respectively, with La0.5Sr0.5CoO3 bottom electrode layers. X-ray diffraction analysis shows that the Bi4Ti3O12 films are grown (001) and (104) oriented on La0.5Sr0.5CoO3(001)/LaAlO3(001) and La0.5Sr0.5CoO3(111)/Al2O3(0001), respectively. These growth behaviors can be explained using arrangements of oxygen ions. Cross-sectional scanning electron microscopy shows that microstructures of the heterostructures depend on the substrates. It is found that the growth behaviors and the microstructure affect leakage current behaviors of the Bi4Ti3O12 layers. Ohmic and space-charge-limited conduction mechanisms are used to explain leakage current behaviors of the Bi4Ti3O12 film on La0.5Sr0.5CoO3/LaAlO3(001) and La0.5Sr0.5CoO3/Al2O3(0001), respectively. © 1995 American Institute of Physics.
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  • 20
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 78 (2001), S. 3690-3692 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: AlN/GaN multiple quantum wells (MQWs) with a well thickness of 26 Å have been grown by metal–organic chemical-vapor deposition. A specially designed photoluminescence (PL) spectroscopy system, which is capable of measuring picosecond time-resolved PL up to 6.2 eV, has been employed to probe the optical properties as well as the carrier transfer and decay dynamics in these MQWs. Optical transitions at 4.039 and 5.371 eV at T=10 K, resulting from the interband recombination between the electrons and holes in the n=1 and n=2 subbands in the wells, have been observed. The band-offset parameter for the AlN/GaN heterostructure has been obtained by comparing the experimental results with the calculations. Carrier dynamics including the relaxation of the electrons and holes from the n=2 and n=1 subband in the conduction and valence bands and the decay lifetimes of the interband transitions have also been measured and analyzed. Detailed subband structures for both the conduction and valence bands in the wells were determined. The implications of our findings on the potential applications of AlN/GaN quantum wells have been discussed. © 2001 American Institute of Physics.
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