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  • Articles  (146)
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  • Articles  (146)
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  • 1
    Electronic Resource
    Electronic Resource
    Microwave frequency ferroelectric domain imaging of deuterated triglycine sulfate crystals (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 2314-2321 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have used a near-field scanning microwave microscope to image domain structure and quantitatively measure dielectric permittivity and nonlinearity in ferroelectric crystals at 8.1 GHz with a spatial resolution of 1 μm. We imaged ferroelectric domains in periodically poled LiNbO3, BaTiO3, and deuterated triglycine sulfate (DTGS) with a signal-to-noise ratio of 7. Measurement of the permittivity and nonlinearity of DTGS in the temperature range 300–400 K shows a peak at the Curie temperature, TC(approximate)340 K, as well as reasonable agreement with thermodynamic theory. In addition, the domain growth relaxation time shows a minimum near TC. We observe coarsening of ferroelectric domains in DTGS after a temperature quench from 360 to 330 K and evaluate the structure factor. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1337600
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  • 2
    Electronic Resource
    Electronic Resource
    Quantitative imaging of dielectric permittivity and tunability with a near-field scanning microwave microscope (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 2751-2758 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe the use of a near-field scanning microwave microscope to image the permittivity and tunability of bulk and thin film dielectric samples on a length scale of about 1 μm. The microscope is sensitive to the linear permittivity, as well as to nonlinear dielectric terms, which can be measured as a function of an applied electric field. We introduce a versatile finite element model for the system, which allows quantitative results to be obtained. We demonstrate use of the microscope at 7.2 GHz with a 370 nm thick Ba0.6Sr0.4TiO3 thin film on a LaAlO3 substrate. This technique is nondestructive and has broadband (0.1–50 GHz) capability. The sensitivity of the microscope to changes in permittivity is Δεr=2 at εr=500, while the nonlinear dielectric tunability sensitivity is Δε113=10−3 (kV/cm)−1. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1150687
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  • 3
    Electronic Resource
    Electronic Resource
    Measurements of the magnetic penetration depth in YBa2Cu3O7−δ thin films by the microstrip resonator technique (1989)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 54 (1989), S. 2710-2712 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have utilized the superconducting microstrip resonator technique to measure the magnetic penetration depth in high Tc oxide thin films in the 1–25 GHz regime. This technique is particularly well suited for thin films, where the absolute value of the penetration depth can be accurately determined. Results for high Tc superconducting thin films show that the value of the penetration depth is sensitive to the preparation conditions of the film, and the temperature dependence is that expected of conventional superconductors.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.101547
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  • 4
    Electronic Resource
    Electronic Resource
    Measurement of the absolute penetration depth and surface resistance of superconductors and normal metals with the variable spacing parallel plate resonator (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 2136-2146 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The variable spacing parallel plate resonator (VSPPR) is a microwave transmission line resonator with a continuously variable thickness of the dielectric spacer between the superconducting or metallic plates, filled by cryogenic liquid or vacuum. We measure the dielectric spacer thickness dependencies of the resonator frequency and quality factor, and fit them to theoretical forms, in order to extract the absolute values of penetration depth, λ, and surface resistance, Rs. A cryogenic micropositioning setup is developed to vary the spacer thickness from 0 to 100 μm with a resolution of 8.5 nm, and to maintain parallelism of the resonator plates. Measurement of ac capacitance between the plates is utilized to directly determine the separation between the resonator plates and to reduce the effect of their tilt and nonflatness on the accuracy of the measured Rs and λ. Because the operating temperature is fixed (77 K), the result for a superconductor is independent of an a priori model for the penetration depth versus temperature. This technique can also be employed as a surface impedance standard for characterization of high temperature superconducting films for microwave applications. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1150596
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  • 5
    Electronic Resource
    Electronic Resource
    Scanned perturbation technique for imaging electromagnetic standing wave patterns of microwave cavities (1998)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 69 (1998), S. 3410-3417 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have developed a method to measure the electric field standing wave distributions in a microwave resonator using a scanned perturbation technique. Fast and reliable solutions to the Helmholtz equation (and to the Schrödinger equation for two-dimensional systems) with arbitrarily shaped boundaries are obtained. We use a pin perturbation to image primarily the microwave electric field amplitude, and we demonstrate the ability to image broken time-reversal symmetry standing wave patterns produced with a magnetized ferrite in the cavity. The whole cavity, including areas very close to the walls, can be imaged using this technique with high spatial resolution over a broad range of frequencies. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1149108
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  • 6
    Electronic Resource
    Electronic Resource
    A broadband method for the measurement of the surface impedance of thin films at microwave frequencies (1994)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 2082-2090 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We present a new technique to measure the complex surface impedance of the mixed state of superconducting thin films over the broad frequency range 45 MHz–20 GHz. The surface impedance is extracted from measurements of the complex reflection coefficient made on the film using a vector network analyzer. The technique takes advantage of a special geometry in which the self-fields from currents flowing in the film are everywhere parallel to the film surface, making it an ideal configuration in which to study vortex dynamics in superconductors. The broadband nature of the measurement system allows us to explore a region of magnetic field–temperature–frequency parameter space of superconductors previously inaccessible with other measurement techniques. The power of the technique is illustrated by measurements on thin films of the high temperature superconductor YBa2Cu3O7−δ.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144816
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  • 7
    Electronic Resource
    Electronic Resource
    Imaging of microwave permittivity, tunability, and damage recovery in (Ba, Sr)TiO3 thin films (1999)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 75 (1999), S. 3180-3182 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We describe the use of a near-field scanning microwave microscope to quantitatively image the dielectric permittivity and tunability of thin-film dielectric samples on a length scale of 1 μm. We demonstrate this technique with permittivity images and local hysteresis loops of a 370-nm-thick Ba0.6Sr0.4TiO3 thin film at 7.2 GHz. We also observe the role of annealing in the recovery of dielectric tunability in a damaged region of the thin film. We can measure changes in relative permittivity εr as small as 2 at εr=500, and changes in dielectric tunability dεr/dV as small as 0.03 V−1. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.125270
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  • 8
    Electronic Resource
    Electronic Resource
    Microwave near-field imaging of electric fields in a superconducting microstrip resonator (1998)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 73 (1998), S. 2491-2493 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We describe the use of a cryogenic near-field scanning microwave microscope to image microwave electric fields from superconducting and normal-metal microstrip resonators. The microscope employs an open-ended coaxial probe and operates from 77 to 300 K in the 0.01–20 GHz frequency range with a spatial resolution of about 200 μm. We describe the operation of the system and present microwave images of Cu and Tl2Ba2CaCu2O8 microstrip resonators, showing standing wave patterns at the fundamental and second harmonic frequencies. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.122492
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  • 9
    Electronic Resource
    Electronic Resource
    Quantitative topographic imaging using a near-field scanning microwave microscope (1998)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 72 (1998), S. 1778-1780 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We describe a technique for extracting topographic information using a scanning near-field microwave microscope. By monitoring the shift of the system's resonant frequency, we obtain quantitative topographic images of uniformly conducting metal surfaces. At a frequency of 9.572 GHz, our technique allows a height discrimination of about 55 nm at a separation of 30 μm. We present topographic images of uneven, conducting samples and compare the height response and sensitivity of the system with theoretical expectations. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.121182
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  • 10
    Electronic Resource
    Electronic Resource
    Imaging microwave electric fields using a near-field scanning microwave microscope (1999)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 74 (1999), S. 156-158 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: By scanning a fine open-ended coaxial probe above an operating microwave device, we image local electric fields generated by the device at microwave frequencies. The probe is sensitive to the electric flux normal to the face of its center conductor, allowing different components of the field to be imaged by orienting the probe appropriately. Using a simple model of the microscope, we are able to interpret the system's output and determine the magnitude of the electric field at the probe tip. We show images of electric field components above a copper microstrip transmission line driven at 8 GHz, with a spatial resolution of approximately 200 μm. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.123137
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