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  • dilatometry  (1)
  • high temperature  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Absolute thermal expansion measurements of single-crystal silicon in the range 300–1300 K with an interferometric dilatometer (1988)
    Springer
    International journal of thermophysics 9 (1988), S. 1101-1109 
    Details
    ISSN: 1572-9567
    Keywords: high temperature ; interferometry ; single-crystal silicon ; thermal expansion
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The thermal expansion coefficient of single-crystal silicon has been measured in the range 300–1300 K using an interferometric dilatometer. The measurement system consists of a double-path optical heterodyne interferometer and a radiant image furnace with a quartz vacuum tube, which provides both accuracy and rapidity of measurement. The uncertainties in length and temperature determination are within 4 nm and 0.4 K, respectively. A high-purity dislocation-free FZ silicon single crystal was used in the study. Thermal expansion coefficients of silicon oriented in the [111] direction have been determined over the temperature range from 300 to 1300 K. The standard deviation of the measurement data from the best fitting for the fifth-order polynomial in temperature is 2.1×10−8 K−1. The present value for the thermal expansion coefficient agrees within 9×10−8K−1 with the interferometric measurement of polycrystalline pure silicon by Roberts (1981) between 300 and 800 K and within 1.2 × 10−7 K−1 with the single-crystal X-ray diffractometric measurement by Okada and Tokumaru (1984) between 300 and 1300 K.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01133277
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  • 2
    Electronic Resource
    Electronic Resource
    Measurement of thermal expansivity of low-expansion glasses by interferometric methods: Results of an interlaboratory comparison (1990)
    Springer
    International journal of thermophysics 11 (1990), S. 937-947 
    Details
    ISSN: 1572-9567
    Keywords: coefficient of linear thermal expansion ; dilatometry ; interferometric dilatometer ; low-expansion glasses ; reference method ; thermal expansion ; standardization
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract An interlaboratory testing program on the measurement of the linear thermal expansion coefficient of low-expansion glasses has been carried out. Three different types of interferometric dilatometers, each located at three different organizations, and two kinds of low-expansion glass materials were selected for the experiments. As a result of the comparison, a reasonable agreement among the different measuring instruments was confirmed, and it was determined that the thermal expansion coefficient for low-expansion glasses can be measured with an accuracy of ±4×10−8 K−1 by using commercially available interferometric dilatometers.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00503585
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    Paper (German National Licenses)
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