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  • 1
    Electronic Resource
    Electronic Resource
    Comparative pharmacokinetics of sodium- and methylglucamine diatrizoate in urography (1973)
    Springer
    European journal of clinical pharmacology 6 (1973), S. 137-140 
    Details
    ISSN: 1432-1041
    Keywords: Urography ; Hypaque® ; Urovist® ; pharmacokinetics ; renal failure
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Medicine
    Notes: Summary Comparative tests were carried out, using a radioactive tracer method, on the pharmacokinetics of sodium and methylglucamine diatrizoate. A biological model was simulated using an analogue computer; and the rate and elimination constants, the elimination half life, and the ratio of tissue entry to tissue elimination constants were calculated. Over the period of time required for X-ray diagnosis, the two salts of the contrast medium acid which were tested did not alter the pharmacokinetics of the contrast medium itself.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00562441
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  • 2
    Electronic Resource
    Electronic Resource
    XPS study of the interface reactions between buffer layers for HTSC thin films and silicon (1992)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 18 (1992), S. 685-690 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: In this work we have studied the interface reactions during e-beam evaporation of yttria-stabilized zirconia (YSZ), yttria (Y2O3) and Y on Si(100) substrates by means of x-ray photoelectron spectroscopy (XPS). A deposition process was developed for the heteroepitaxial growth of YSZ and Y2O3. A high amount of metallic Zr in the YSZ vapour results in an in situ reduction of the native silicon oxide layer, allowing the growth of high-quality YSZ films even on uncleaned Si substrates. A similar in situ reduction process was achieved for the Y2O3 film growth on uncleaned substrates by a predeposition of metallic Y. The deposition of YBa2Cu3O7-δ (YBCO) films on YSZ/Y2O3/Si multilayers by dc magnetron sputtering resulted in critical current densities of the YBCO layer in excess of 2 × 106 A cm-2.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740180909
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