ISSN:
0142-2421
Keywords:
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
A mass-separated low-energy ion beam system was used to deliver pure OH+ and NH+ to 15nm thick polystyrene films on silicon in ultrahigh vacuum. This was done in an effort to produce specific surface chemical functional groups. X-ray photoelectron spectroscopy showed that when the bombardment energy of OH+ exceeded 10 eV, or the dose was higher than 1 × 1016 ions cm-2, a mixture of C—OH, C—C=O and C—COOH groups was produced, along with severe damage to the aromatic rings. However, for bombardment at 10 eV with a dose of 1 × 1016 ions cm-2, only C—OH (or COR) groups were found. Similarly, bombardment with NH+ at 10 eV and a dose 1 × 1016 ions cm-2 induced incorporation of a single nitrogen-containing functionality. The C 1s data indicated that the major chemical functionality on such surfaces in a C—NH2 (or C—NHR) group with a minor component of C—(NH2)2. Hence, surface functionality can indeed be controlled by altering the molecular nature, energy and dose of the bombarding species.
Additional Material:
7 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/sia.740231304
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