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  • Wiley-Blackwell  (2)
  • 1
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Understanding the mechanisms of hydrogen ingress into pressure tubes fabricated from zirconium-2.5% (w/w) niobium alloy requires knowledge of the hydrogen concentration in the surface oxides, of the oxide/metal interface and in the alloy phase beneath the interface. Secondary ion mass spectrometry (SIMS) has attractive capabilities for detecting hydrogen isotopes in such surface films, but its quantitative response and spatial resolution are controversial for hydrogen because of the strong tendency for the element to migrate, owing to thermal and sputtering effects. High sputter rate conditions have been used here, which result in an improved capability to detect hydrogen in Zr—Nb alloy and ZrO2 down to concentrations of 〈2 × 1017 atoms cm-3 (〈0.1 ppm, w/w). Quantitation of deuterium concentrations has been accomplished by SIMS calibrated using ion implants and, in some cases, verified by nuclear reaction analysis (NRA).
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 21 (1994), S. 44-50 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The preferred XPS methodology for measurement of SiO2 film thickness on polished silicon surfaces is discussed. A precise measurement of the photoelectron attenuation length was made using nuclear reaction analysis (NRA) to calibrate the film thicknesses. Anodic oxide films on Si, which are very reproducible in thickness, are used as test samples. Appropriate corrections for the problem of adventitious carbon are shown. Under some conditions, the phenomenon of photoelectron diffraction has a significant effect on the measurements, and improvements to the precision by rotating the sample about the normal during data acquisition are demonstrated.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
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