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  • 1
    Electronic Resource
    Electronic Resource
    Transmission-line matrix method for solving the multidimensional continuity equation (1993)
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 6 (1993), S. 233-236 
    Details
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: We have extended the one-dimensional transmission-line modelling (TLM) of diffusion, drift and recombination of charge carriers in semiconductors to multiple dimensions. Detailed TLM formulation of the continuity transport equation in a more general form is presented.
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jnm.1660060307
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  • 2
    Electronic Resource
    Electronic Resource
    A comparative study of two TLM networks for the modelling of diffusion processes (1993)
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 6 (1993), S. 161-164 
    Details
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: A comparative study of two alternative networks for TLM modelling of diffusion processes has been undertaken. Some of their inherent advantages and disadvantages are analysed according to the ratio between the impedance of the lossless transmission lines and the lumped resistance. Their relative accuracy and utility in controlling the timestep automatically are examined.
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jnm.1660060208
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  • 3
    Electronic Resource
    Electronic Resource
    An error parameter in TLM diffusion modelling (1992)
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 5 (1992), S. 129-137 
    Details
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: This paper reports the results of a study of an error parameter, m, which has been proposed as a measure for determining the effects on accuracy of the basic assumptions upon which TLM modelling of diffusion and heat flow has been founded. The nature of the m parameter is studied in detail by using a two-dimensional thermal diffusion problem. The use of m in the implementation of automatic timestepping is discussed in a practical three-dimensional engineering problem.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jnm.1660050207
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  • 4
    Electronic Resource
    Electronic Resource
    Implementation of timestep changes in transmission-line matrix diffusion modelling (1992)
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 5 (1992), S. 251-257 
    Details
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: This paper details general expressions for implementing timestep transformations in transmission-line matrix (TLM) modelling of diffusion processes. The expressions can be conveniently incorporated into any TLM routine which models multidimensional problems using a variable meshing technique.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jnm.1660050406
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  • 5
    Electronic Resource
    Electronic Resource
    TLM TREATMENT OF A GENERAL DIFFUSION FLUX BOUNDARY CONDITION (1996)
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 9 (1996), S. 327-333 
    Details
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: An approach of using a current-controlled voltage source analogy to account for a general boundary condition of particle or thermal flux in transmission-line matrix (TLM) diffusion modelling has been developed. For mass diffusion, this boundary condition is expressed as D ∂C/∂x + αC = 0, where C is the concentration, D is the diffusion coefficient, and α is a parameter characterizing the out-diffusion mobility across the boundary of interest. Confirmation of the TLM numerical treatment through comparison with analytical solutions is presented. Besides the open-circuit and short-circuit boundaries, the matched-load boundary is also found to be a special case of the present boundary condition. This extension of the boundary treatment allows the highly flexible TLM method to be applied to a greater variety of diffusion problems.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Fast atom bombardment mass spectra of telluronium salts (1992)
    Chichester : Wiley-Blackwell
    Biological Mass Spectrometry 27 (1992), S. 695-698 
    Details
    ISSN: 0030-493X
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Notes: The fast atom bombardment (FAB) mass spectra of telluronium salts were studied. The spectra exhibit the intact cation (C+) and cluster ions ([M + C]+). The principal fragment ions in the FAB mass spectra of telluronium salts are [RTe]+, [R2Te]+·, [R2Te - H]+, [RTeR′]+·, and [RTeR′ + H]+. When the anion was [BPh4]-, interesting cluster ions such as [M + C - BPh3]+ appeared.
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/oms.1210270609
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  • 7
    Electronic Resource
    Electronic Resource
    Fast atom bombardment mass spectra of stibonium salts (1990)
    Chichester : Wiley-Blackwell
    Biological Mass Spectrometry 25 (1990), S. 645-648 
    Details
    ISSN: 0030-493X
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Notes: The positive-ion fast atom bombardment (FAB) mass spectra of stibonium salts have been studied. The spectra exhibit an abundant intact cation (C+) and fragment ions resulting from the loss of R, R′ or stable neutral species from the cation. The principal fragment ions in the FAB mass spectra of stibonium salts are [R3Sb]+·, [R2Sb]+, [R2SbH2]+, [RSbR′]+, [RSbH]+, [RSb - H]+ and [R2SbR']+·. In most cases, [ M + C] + cluster ions were detected. When the anion was bromine, the adduct ions [M + (R - H)Sb]+, [C + (R-H)]+ and [ C + (R′ - H)]+ were also observed, whereas when the anion was [BPh4]-, interesting cluster ions such as [M + (BR′ - H)]+ and [M + (BR′ - 3H)]+ appeared.
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/oms.1210251204
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