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  • 1
    Publication Date: 1980-01-01
    Print ISSN: 0340-3793
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Published by Springer
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  • 2
    Publication Date: 1982-12-01
    Print ISSN: 0947-8396
    Electronic ISSN: 1432-0630
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Published by Springer
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  • 3
    Publication Date: 1989-05-01
    Print ISSN: 0947-8396
    Electronic ISSN: 1432-0630
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Published by Springer
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  • 4
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 48 (1989), S. 457-463 
    ISSN: 1432-0630
    Keywords: 71.55 ; 85.30
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Capacitance DLTS measurements have been performed in VPE GaAs MESFETs prepared on Bridgman Cr-doped and LEC undoped semi-insulating substrates. A band of electron traps not intrinsically related to the VPE growth process and accumulating near the metal (gate) — semiconductor interface was detected in all the samples. Deeper regions into the channel were free from any detectable trap. Near pinch-off conditions, a positive capacitance signal was found to dominate the DLTS spectra only in the case of samples prepared on Cr-doped substrates. The hypothesis of this positive transient being related to changes in the occupation of surface states in the ungated surface access regions has been checked by comparing experimental and calculated dependencies of the signal amplitude on reverse gate voltage. Unexplained discrepancies, together with the absence of positive signal in MESFETs prepared on LEC undoped substrates, suggest the possibility of hole emission from hole traps within the bulk of the device.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 21 (1980), S. 83-90 
    ISSN: 1432-0630
    Keywords: 68.55 ; 84.60 ; 85.60
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Cd1−x Zn x S/p-GaAs heterojunctions for solar cell applications have been prepared by growing single crystal Cd1−x Zn x S epitaxial layers on (111)GaAs substrates through a vapour phase chemical transport method using the close-spaced geometry and H2 as a transport agent. Electrical and photovoltaic properties of the heterojunctions have been investigated and discussed in connection with the main features of the growth technique. AM1 power conversion efficiencies up to 6.2% have been measured and possible improvements have been examined.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 29 (1982), S. 225-231 
    ISSN: 1432-0630
    Keywords: 71.55 ; 85.30
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Admittance measurements have been performed to reveal trap levels within the space charge region of CdZnS/p-GaAs heterojunctions prepared by chemical vapour deposition in the close-spaced geometry. The presence, between GaAs and the CdZnS layer, of a transition region containing a high concentration of acceptor-like traps is hypothesized. Taking into account electric field effects, a ionization energy greater than 0.28 eV is estimated for the trap state.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Springer
    Il nuovo cimento della Società Italiana di Fisica 2 (1983), S. 1561-1581 
    ISSN: 0392-6737
    Keywords: Conductivity phenomena in semiconductors and insulators
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Description / Table of Contents: Riassunto Si considera l'ammettenza di una giunzionep +/n contenente stati di gap caratterizzati da una distribuzione continua in energia. Attraverso un'analisi della carica spaziale si perviene a soluzioni analitiche approssimate per la conduttanza e la capacità del diodo, valide per basse densità degli stati di gap. Si presentano e discutono risultati numerici per due diversi tipi di distribuzioni in energia: i) distribuzioni gaussiane, ii) code esponenziali prossime al fondo della banda di conduzione. In entrambi i casi si mostra che esperimenti di spettroscopia basati su misure di ammettenza, ma condotti in modo incompleto, possono indurre a scambiare erroneamente una distribuzione continua di stati per un apparente livello discreto. Si indicano e discutono criteri non ambigui per evitare simili procedure.
    Abstract: Резюме Рассматривается проводимостьp +/n перехода, имеюшего состояния шели, характеризуюшееся непрерывным распределением по знергии. Получаются приближенные аналитические решения для проводимости и емкости диода, используя анализ пространственного заряда в случае низкой плотности состояний шели. Приводятся численные результаты для двух типов знергетических распределений: 1) распределения гауссовой формы и 2) экспоненциальные хвосты на краю зоны проводимости. Показывается, что в обоих случаях спектроскопические измерения неполной проводимости могут привести к ошибочному появлению непрерывного распределения состояний шели для очевидного дискретного глубокого уровня. Предлагаются и обсуждаются однозначные критерии, чтобы избежать ошибочной интерпретации.
    Notes: Summary The small-signal a.c. admittance of ap +/n junction with gap states having a continuous distribution in energy is considered. Approximate analytical solutions for both diode conductance and capacitance are derived, through a space charge analysis, in the case of a low density of gap states. Numerical results on the zero-bias admittance are given and discussed for two particular energy distributions: i) Gaussian shapes and ii) exponential tails at the conduction band edge. It is shown that in both cases incomplete admittance spectroscopy experiments may lead to mistake the occurrence of a continuous distribution of gap states for an apparent discrete deep level. Unambiguous criteria to avoid misleading procedures are given and discussed.
    Type of Medium: Electronic Resource
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