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  • 1
    Electronic Resource
    Electronic Resource
    s.l. ; Stafa-Zurich, Switzerland
    Materials science forum Vol. 203 (Feb. 1996), p. 223-230 
    ISSN: 1662-9752
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    s.l. ; Stafa-Zurich, Switzerland
    Materials science forum Vol. 182-184 (Feb. 1995), p. 167-170 
    ISSN: 1662-9752
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    Il nuovo cimento della Società Italiana di Fisica 13 (1991), S. 1-14 
    ISSN: 0392-6737
    Keywords: Specific structures of elements and alloys
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Summary X-ray double-crystal rocking curves of Ga1−x Al x As/GaAs heterostructures have been calculated using a dynamical diffraction model for the general case of Bragg reflection geometry. Different experimental configurations have been considered and the possibility of studying both slightly mismatched and relatively thin layers has been investigated. Experimental rocking curves have been measured using the CuKα 1 radiation, the 004 symmetric reflection and a perfect crystal as the monochromator. An excellent agreement between calculated and experimental rocking curves has been found and this demonstrates the reliability of both the experimental procedure and the theoretical approach.
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  • 4
    ISSN: 0392-6737
    Keywords: Methods of deposition of films and coatings ; film growth and epitaxy ; Order, lattices and ordered algebraic structures ; III–V semiconductors ; X-ray scattering
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Summary The cationic ordering in InGaP epilayers grown by low-pressure vapour phase epitaxy on GaAs substrates has been investigated by X-ray diffraction. The effects of both the substrate miscut and the doping with Si and Zn have been studied. It has been found that ordering effects occur inside relatively small domains on (1–11) and (−111) planes; however, by increasing the miscut angle the domains of the first kind tend to increase their dimensions, while the second ones tend to disappear. Moreover, doping with impurities substituting cations is seen to destroy the order. Photoluminescence anomalies have been revealed and correlated to the size and ordering degree of the ordered domain.
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  • 5
    Electronic Resource
    Electronic Resource
    Springer
    Il nuovo cimento della Società Italiana di Fisica 14 (1992), S. 129-139 
    ISSN: 0392-6737
    Keywords: X-ray determination of structure
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Summary The double crystal X-ray rocking curves of Ga1−x Al x As/GaAs laser structures, with both a single and double confinement, have been calculated on the basis of the Takagi-Taupin dynamica theory. It has been demonstrated that very small changes in the thickness and composition of the active and the internal confining layers give rise to dramatic modifications of the rocking curves; this offers in principle a very powerful tool for measuring very precisely thickness and composition of these layers. However, the shape of the Bragg peak of the external confining layers exhibits a nearly period behaviour as a function of the thickness of the active or the internal confining layer; a simple relation between the thickness period and the composition difference of the considered layers has been obtained for the first time. Finally, the effect of the interchange of the confining layers on the rocking curves has been discussed.
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  • 6
    Electronic Resource
    Electronic Resource
    Springer
    Il nuovo cimento della Società Italiana di Fisica 2 (1983), S. 1561-1581 
    ISSN: 0392-6737
    Keywords: Conductivity phenomena in semiconductors and insulators
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Description / Table of Contents: Riassunto Si considera l'ammettenza di una giunzionep +/n contenente stati di gap caratterizzati da una distribuzione continua in energia. Attraverso un'analisi della carica spaziale si perviene a soluzioni analitiche approssimate per la conduttanza e la capacità del diodo, valide per basse densità degli stati di gap. Si presentano e discutono risultati numerici per due diversi tipi di distribuzioni in energia: i) distribuzioni gaussiane, ii) code esponenziali prossime al fondo della banda di conduzione. In entrambi i casi si mostra che esperimenti di spettroscopia basati su misure di ammettenza, ma condotti in modo incompleto, possono indurre a scambiare erroneamente una distribuzione continua di stati per un apparente livello discreto. Si indicano e discutono criteri non ambigui per evitare simili procedure.
    Abstract: Резюме Рассматривается проводимостьp +/n перехода, имеюшего состояния шели, характеризуюшееся непрерывным распределением по знергии. Получаются приближенные аналитические решения для проводимости и емкости диода, используя анализ пространственного заряда в случае низкой плотности состояний шели. Приводятся численные результаты для двух типов знергетических распределений: 1) распределения гауссовой формы и 2) экспоненциальные хвосты на краю зоны проводимости. Показывается, что в обоих случаях спектроскопические измерения неполной проводимости могут привести к ошибочному появлению непрерывного распределения состояний шели для очевидного дискретного глубокого уровня. Предлагаются и обсуждаются однозначные критерии, чтобы избежать ошибочной интерпретации.
    Notes: Summary The small-signal a.c. admittance of ap +/n junction with gap states having a continuous distribution in energy is considered. Approximate analytical solutions for both diode conductance and capacitance are derived, through a space charge analysis, in the case of a low density of gap states. Numerical results on the zero-bias admittance are given and discussed for two particular energy distributions: i) Gaussian shapes and ii) exponential tails at the conduction band edge. It is shown that in both cases incomplete admittance spectroscopy experiments may lead to mistake the occurrence of a continuous distribution of gap states for an apparent discrete deep level. Unambiguous criteria to avoid misleading procedures are given and discussed.
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 6890-6894 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: n-type Si- and Sn-doped InP homoepitaxial layers have been grown on (001) Fe-doped semi-insulating InP substrates by metal organic vapor phase epitaxy and liquid phase epitaxy, respectively. The net carrier concentration has been determined by conventional Hall measurements, while the total dopant concentration has been evaluated by secondary ion mass spectrometry. The change in lattice constant has been carefully measured by x-ray double crystal diffractometry as a function of the dopant concentration. A lattice dilation has been observed for both dopants, but the Sn doping has been found to be about eight times less effective than the Si doping. The results could not be explained by Vegard's law. © 1996 American Institute of Physics.
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  • 8
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Lattice distortions due the implantation of Fe+ ions in InP semi-insulating crystals have been investigated by means of high-resolution x-ray-diffraction and x-ray standing-wave methods. The effects of both the implantation dose and the annealing time were studied. It is shown that the x-ray standing-wave method provides valuable complementary information on strain and damage in the subsurface layer and permits one to distinguish between different distortion profiles that give practically the same kinematical diffraction curve. © 1994 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 4156-4160 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A Raman spectroscopy study on highly mismatched GaAs layers with thickness ranging from 15 nm to 6.6 μm and grown by metal-organic vapor-phase epitaxy on InP (001) substrates, is reported. Both LO and TO GaAs phonons have been observed in backscattering and Brewster geometries. In the thinnest samples large frequency red shifts with respect to the bulk are measured indicating large residual tensile strains. The Raman measurements agree with x-ray-diffraction measurements and confirm that layers thinner than 30 nm exhibit a 3D growth mechanism as suggested by transmission electron microscopy investigations.
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 66 (1989), S. 1975-1983 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Inx Ga1−x As/GaAs single heterostructures have been grown by molecular-beam epitaxy with different growing rates and In molar fractions. Indium composition, layer thickness, and residual strain have been measured mainly by Rutherford backscattering/channeling spectrometry and the results on selected samples compared with the results of other techniques like Auger electron spectroscopy and single- and double-crystal x-ray diffraction. Cathodoluminescence, x-ray topography, transmission electron microscopy, and ion dechanneling have been employed to observe dislocations and to characterize their nature and density. While the onset of misfit dislocations has been found to agree with the predictions of the equilibrium theory, the strain release has been found to be much lower than predicted and the results are compared with the available metastability or nucleation models. Present results are in best agreement with nucleation models. Moreover, annealing experiments show that these heterostructures are at (or very close to) thermodynamic equilibrium.
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