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  • 72.80  (1)
  • 73.20  (1)
  • 73.40. Gk  (1)
  • Springer  (3)
  • Oxford University Press
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  • Springer  (3)
  • Oxford University Press
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  • 1
    ISSN: 1432-0630
    Keywords: 72.20 ; 72.80 ; 78.65
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Fine-grained (d≈0.1 μm), polycrytalline SiC films were prepared on top of insulating and optically transparent sapphire substrates by means of a thermal crystallization technique. Optical absorption measurements indicate that the individual SiC grains consist of relatively defect-free β-SiC surrounded by high-defect density grain-boundary material. Nominally undoped material exhibits a low de conductivity (δ≈10−8 Ω−1 cm−1) in the dark and an efficient photoconductivity apon illumination with short-wavelength UV light. The temperature dependence of the de transport exhibits a quasi-Arrhenius-type behaviour with average activation energies of the order to 0.6 eV. A characteristic feature of this kind of transport is a continuous increase in activation energy with increasing film temperature. Upon doping with N, P and Al ions, the average activation energy is decreased and room temperature conductivities of the order of 0.1 Ω−1 cm−1 are reached. Doping with B ions, on the other hand, only leads to high-resistivity material. It is shown that the electronic transport in doped SiC-On-Sapphire (SiCOS) films can be successfully modelled in terms of a grain-boundary-dominated conduction process. In this process thermal activation across potential barriers at the grain-boundary surfaces competes with funneling through these same barriers.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1432-0630
    Keywords: 72.40 ; 73.20
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Excess charge carrier kinetics in moderately doped pSi wafers were investigated with a contactless transient photoconductivity method, i.e. the time-resolved microwave conductivity (TRMC) method. The surface structure of the wafers was changed by etching and polishing, the volume structure by irradiation with high-energy electrons. Comparison of the photoconductivity decay after excitation by strongly absorbed light and by weakly absorbed light was used to distinguish between surface and volume decay processes. The experimental results deviate from predictions based on a linear surface decay rate. These results are discussed and suggestions are made for the use of transient photoconductivity measurements to characterize semiconductor wafers.
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  • 3
    ISSN: 1573-7357
    Keywords: 74.50. +r ; 74.70. Vy ; 73.40. Gk
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract A periodic structure has been observed in the tunneling characteristics of HTSC break junctions. This structure is explained in terms of the electron-hole interference effect in the surface layer, which causes the formation of bound states in the normal regions N of the SNINS-type junctions. Good qualitative agreement has been found between experimental data and the predictions of the Arnolds proximity model. Several parameters of the SNINS-type structures have been derived from studies of Fiske resonances in HTSC Josephson break junctions in weak magnetic fields.
    Type of Medium: Electronic Resource
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