Electronic Resource
Copenhagen
:
International Union of Crystallography (IUCr)
Applied crystallography online
29 (1996), S. 493-494
ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
This work describes a detector-fixed method in which X-ray photons are collected on different points of the sensitive area of the detector without movement of the detector and which is suitable for measuring a single-crystal orientation using (ω, φ) rotations. This method was used to determine the orientation of a silicon wafer whose (100) plane makes a small angle (misorientation angle) with the surface. ω scans of the 400 reflection were measured as a function of φwhile χ and 2θ were fixed at 0 and 69°, respectively.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889896000684
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