Publication Date:
2015-09-24
Description:
Author(s): Mauro Rovezzi, Wolfgang Schlögelhofer, Thibaut Devillers, Nevill Gonzalez Szwacki, Tian Li, Rajdeep Adhikari, Pieter Glatzel, and Alberta Bonanni Synchrotron radiation x-ray absorption and emission spectroscopy techniques, complemented by high-resolution transmission electron microscopy methods and density functional theory calculations, are employed to investigate the effect of Mn in Al x Ga 1 − x N : Mn samples with an Al content up to 100%. The at… [Phys. Rev. B 92, 115308] Published Mon Sep 21, 2015
Keywords:
Semiconductors II: surfaces, interfaces, microstructures, and related topics
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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