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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 80 (1996), S. 4411-4420 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A method to deduce energy distributions of defects in the band gap of a semiconductor by measuring the complex admittance of a junction is proposed. It consists of calculating the derivative of the junction capacitance with respect to the angular frequency of the ac signal corrected by a factor taking into account the band bending and the drop of the ac signal over the space charge region of the junction. Numerical modeling demonstrates that defect distributions in energy can be reconstructed by this method with high accuracy. Defect distributions of polycrystalline Cu(In,Ga)Se2 thin films are determined by this method from temperature dependent admittance measurements on heterojunctions of Cu(In,Ga)Se2 with ZnO that are used as efficient thin film solar cells. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 69 (1996), S. 2888-2890 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Admittance spectroscopy was measured on Cu(In,Ga)(S,Se)2 thin film and single crystal heterojunctions. The emission rates of defects for various near-stoichiometric compositions follow a Meyer–Neldel rule, showing increasing attempt-to-escape frequencies with increasing defect depth. Defects in highly (In,Ga)-rich material showed lower attempt-to-escape frequencies and follow a separate Meyer–Neldel relation. Repetitive air annealing of a CuInSe2 heterojunction revealed a shift of the depth and capture cross section of an observed defect. © 1996 American Institute of Physics.
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 2490-2495 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Results of a pilot study with a spectro-streak apparatus applying a grating microspectrometer with a self-focusing reflection grating are reported. The microspectrometer chip (dimensions: 17×6.4 mm2; 125 μm effective thickness of the three-layer x-ray resist system), fabricated with the versatile LIGA technique, has been adapted to a picosecond streak camera. Performance tests have been carried out with a fluorescent probe exhibiting a dynamic Stokes shift of the exciplex fluorescence band due to solvation of the charge transfer dipole within about 400 ps. The use of a LIGA microspectrometer in ultrafast spectroscopy proved to be of advantage in time-resolved studies of complex luminescence spectra where a moderate spectral resolution is required and a large spectral range must be covered. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 69 (1996), S. 25-27 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The effect of a postdeposition anneal on the structure and dielectric properties of epitaxial BaxSr1−xTiO3 (BST) thin films (x=0.35–0.65) have been measured. The films were grown by pulsed laser deposition on LaAlO3 (001) substrates. The films were single phase and (001) oriented with a lattice parameter larger than the bulk. The dielectric properties of the x=0.35 film exhibited a broad temperature dependence and a peak at 168 K, which is 36 K below the peak observed in bulk BST (x=0.35). Annealing films for 8 h in flowing oxygen at 900 °C caused the lattice parameter to decrease and dielectric properties to become more like the bulk. Annealing also resulted in an increased electric field dependent dielectric tuning without increased dielectric loss. © 1996 American Institute of Physics.
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  • 5
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 80 (2002), S. 1544-1546 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present a systematic study of closely stacked InAs/GaAs quantum dots (QDs) grown at low growth rates. Transmission electron microscopy reveals that for thin spacer layers vertically aligned QDs merge into one large QD. After capping the initial QD layer the GaAs surface is decorated with well-developed nanostructures, which act as nucleation centers for the QDs deposited in the second layer. Despite the size increase, photoluminescence (PL) experiments show a systematic blueshift up to 103 meV of the QD related signal with decreasing spacer thickness. We explicitly show that this significant blueshift cannot fully be ascribed to specific growth phenomena, but instead is caused by the actual presence of the second dot layer. We report a PL linewidth as narrow as 16 meV at low temperature for a sample with 5 nm spacer thickness. © 2002 American Institute of Physics.
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  • 6
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 80 (2002), S. 1279-1281 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Low-temperature epitaxial growth of Si–Ge heterostructures opens possibilities for synthesizing very small and abrupt low-dimensional structures due to the low adatom surface mobilities. We present photoluminescence from Ge quantum structures grown by molecular-beam epitaxy at low temperatures which reveals a transition from two-dimensional to three-dimensional growth. Phononless radiative recombination is observed from 〈105〉 faceted Ge quantum dots with height of approximately 0.9 nm and lateral width of 9 nm. Postgrowth annealing reveals a systematic blueshift of the Ge quantum dot's luminescence and a reduction in nonradiative recombination channels. With increasing annealing temperatures Si–Ge intermixing smears out the three-dimensional carrier localization around the dot. © 2002 American Institute of Physics.
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  • 7
    Electronic Resource
    Electronic Resource
    Springer
    Journal of applied electrochemistry 25 (1995), S. 770-775 
    ISSN: 1572-8838
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Electrical Engineering, Measurement and Control Technology
    Notes: Abstract The effect of pH on the nucleation stages of nickel electrodeposition on vitreous carbon has been analysed using low nickel concentrations, without additives. The experimental results indicated that there was a change in the electrochemical response of the system at 4 〈 pH 〈 4.5. A predischarge adsorption ascribed to nickel(II) species was observed with a different surface coverage depending on the pH. Moreover, different inhibition and 3D nucleation processes were detected in varying experimental conditions.
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  • 8
    Electronic Resource
    Electronic Resource
    Springer
    Journal of applied electrochemistry 24 (1994), S. 1249-1255 
    ISSN: 1572-8838
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Electrical Engineering, Measurement and Control Technology
    Notes: Abstract Zinc-nickel alloys have been electrodeposited from a simple bath containing only zinc, nickel and ammonium chlorides. The composition, morphology, structure and corrosion resistance of the alloys obtained with this bath have been studied and the influence of some additives, normally used to reduce the stress of the deposits, has also been analysed. Among these additives it has been found that the aromatic sulfonimide does not significantly modify the deposit characteristics but improves the corrosion resistance of the alloys. Moreover, the applicability of two statistical methods to a deposition process has been tested, to obtain the main factor determining the deposit composition.
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  • 9
    Electronic Resource
    Electronic Resource
    Springer
    Journal of applied electrochemistry 21 (1991), S. 709-715 
    ISSN: 1572-8838
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Electrical Engineering, Measurement and Control Technology
    Notes: Abstract The initial stages of the electrodeposition of nickel onto vitreous carbon from ethanol/water chloride solutions was studied in the presence and absence of some organic compounds. The influence of both additives and metal concentration was investigated by cyclic voltammetry, potential step experiments and differential capacity measurements. The role of the additives in the deposition process related to their adsorption, both on vitreous carbon and on vitreous carbon/nickel deposited electrodes, is also discussed.
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  • 10
    Electronic Resource
    Electronic Resource
    Springer
    Journal of applied electrochemistry 20 (1990), S. 635-639 
    ISSN: 1572-8838
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Electrical Engineering, Measurement and Control Technology
    Notes: Abstract The electroplating of Zn−Ni alloy films from a chloride bath has been studied under different plating conditions, both in the absence and presence of a phenolic derivative. Under the conditions examined, the electrodeposition of the alloys belonged to the anomalous type. The morphology and composition of the deposits varied with current density, temperature, bath composition and additive concentration. The results show that the additive modifies the structure and surface topography of the deposits to a large extent and produces smoother deposits. The corrosion resistance of the alloys has been analyzed by means of salt-spray tests.
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