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  • Articles  (220)
  • Oxford University Press  (149)
  • American Institute of Physics (AIP)  (71)
  • Medicine  (148)
  • Electrical Engineering, Measurement and Control Technology  (72)
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  • Articles  (220)
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  • 1
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    A three-axis SQUID-based absolute vector magnetometer (2015)
    American Institute of Physics (AIP)
    Details
    Publication Date: 2015-10-24
    Description: We report on the development of a three-axis absolute vector magnetometer suited for mobile operation in the Earth’s magnetic field. It is based on low critical temperature dc superconducting quantum interference devices (LTS dc SQUIDs) with sub-micrometer sized cross-type Josephson junctions and exhibits a white noise level of about 10 fT/Hz 1/2 . The width of superconducting strip lines is restricted to less than 6 μ m in order to avoid flux trapping during cool-down in magnetically unshielded environment. The long-term stability of the flux-to-voltage transfer coefficients of the SQUID electronics is investigated in detail and a method is presented to significantly increase their reproducibility. We further demonstrate the long-term operation of the setup in a magnetic field varying by about 200 μ T amplitude without the need for recalibration.
    Print ISSN: 0034-6748
    Electronic ISSN: 1089-7623
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Published by American Institute of Physics (AIP)
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  • 2
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    New experimental perspectives for soft x-ray absorption spectroscopies at ultra-low temperatures below 50 mK and in high magnetic fields up to 7 T (2016)
    American Institute of Physics (AIP)
    Details
    Publication Date: 2016-04-30
    Description: A new ultra-low temperature experiment including a superconducting vector magnet has been developed for soft x-ray absorption spectroscopy experiments at third generation synchrotron light sources. The sample is cooled below 50 mK by a cryogen free 3 He- 4 He dilution refrigerator. At the same time, magnetic fields of up to ±7 T in the horizontal direction and ±0.5 T in the vertical direction can be applied by a superconducting vector magnet. The setup allows to study ex situ and in situ prepared samples, offered by an attached UHV preparation chamber with load lock. The transfer of the prepared samples between the preparation section and the dilution refrigerator is carried out under cryogenic temperatures. First commissioning studies have been carried out at the Variable Polarization XUV Beamline P04 at PETRA III and the influence of the incident photon beam to the sample temperature has been studied.
    Print ISSN: 0034-6748
    Electronic ISSN: 1089-7623
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Published by American Institute of Physics (AIP)
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  • 3
    Electronic Resource
    Electronic Resource
    Water vapor interference in the measurement of ozone in ambient air by ultraviolet absorption (1991)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 62 (1991), S. 223-228 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Atmospheric observations show that ultraviolet absorption ozone monitors used for ambient measurements can, under some conditions, respond to variable water vapor concentrations with quantitative responses varying from instrument to instrument. A combined theoretical and experimental study shows that these monitors should not respond to water vapor. The source of the response appears to be the varying extinction of ultraviolet light by the windows of the optical cells. A change of 6-g H2O kg air−1 gives, at maximum, an extinction equivalent to 800 ppbv ozone. This changing extinction appears to be related to surface contaminants or surface structure on the cell windows. Instruments with such cell windows can give spurious ozone results in some measurement sequences.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1142311
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  • 4
    Electronic Resource
    Electronic Resource
    An automated light scattering system scanning in two spherical angles (1990)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 61 (1990), S. 2069-2072 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have designed and built a light scattering system that can detect scattered light in two spherical angles with scanning ranges more than 270° about the vertical axis and 100° about a horizontal axis. The detector and the sample holder are automated by high-precision stepping motors with a minimal angular increment 0.01° or 0.02°. A novel modular design in the detector allows the experimenter to examine the image of the scattering object and the direction of the scattered light while the detector is fixed at the measurement position. The angular resolution of the system is smaller than 0.19° in both azimuthal and polar directions. This setup has been successfully applied to study the static and dynamic properties of the ordered phases in colloidal solutions.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1141419
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  • 5
    Electronic Resource
    Electronic Resource
    Recent results from experiments on x-ray confining cavities (abstract) : Eighth topical conference on high−temperature plasma diagnostics (1990)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 61 (1990), S. 2813-2813 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: In continuation of the collaborative work between the Institute of Laser Engineering, Osaka and Max–Planck-Institut für Quantenoptik, Garching on x-ray confining cavities, we have performed a new series of experiments using the GEKKO-XII laser facility (4 kJ, 0.9 ns, λ=0.35 μm). The results from two experimental objectives will be presented. The first objective was the direct observation of the x-ray confinement effect in a cavity. A special design target allowed the simultaneous measurement of the x-ray flux emanating from a "closed'' cavity and an "open'' cavity. The second objective was the study of radiation transport mechanism in high- and low-Z materials. Thin foils of Au and Al were used as windows on diagnostic holes of x-ray confining cavities and their emission was compared to that of an open hole. A summary of the main results will be presented.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1141839
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  • 6
    Electronic Resource
    Electronic Resource
    Noise and the Kelvin method (1991)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 62 (1991), S. 1326-1332 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The Kelvin probe, used to measure changes in work function (wf), has proved particularly useful as a UHV surface analysis technique, having applications in the study of thin films, adsorption kinetics, surface photovoltage spectroscopy, surface topographies, etc. However the Kelvin circuit is plagued by noise problems, which are considerably enhanced by long connecting wires and the nonideal UHV environment. Careful shielding is essential in order to improve the signal-to-noise (S/N) ratio, especially at backing potentials close to the null condition. Although lock-in-amplifier (LIA) based automatic compensation systems are available they operate on low signal levels and are prone to electromagnetic pickup from the driving element and mechanical instabilities of the vibrating capacitor. We discuss the general noise spectrum and describe an alternative "off-null'' approach utilizing a data-acquisition-system (DAS) based measuring system that features an active suspension system (ASS), automatic set-up, and software elimination of driver talkover. This system has applications where very high resolution (〈0.1 meV) is required, or if low S/N ratios caused by reduced probe dimensions or a high noise background would otherwise prejudice the measurement.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1142494
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  • 7
    Electronic Resource
    Electronic Resource
    Modified sample holder for low-temperature deep-level transient spectroscopy, current-voltage and capacitance-voltage measurements (1992)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 2101-2102 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: This note describes the design, construction, and test results of a modified sample holder used during low-temperature deep-level transient spectroscopy, current-voltage and capacitance-voltage measurements. This improved sample holder allows temperature scan rates of up to 6 K/min with a temperature shift of less than 1 K. High electrical isolation makes this sample holder also suitable for low-temperature current-voltage and capacitance-voltage measurements.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1143175
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  • 8
    Electronic Resource
    Electronic Resource
    Synergy of multiviewing spectroscopic diagnostics on COMPASS-D (invited) : Papers from the thirteenth topical conference on high temperature plasma diagnostics (2001)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 72 (2001), S. 881-887 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: In the COMPASS-D tokamak three multiviewing diagnostic systems are combined by using the same collection optics. HeI line ratios from a helium thermal jet provide detailed edge Te(r) and ne(r) profiles. The spectrometer also provides the Dα profile. A Doppler spectrometer system provides Ti and Vθ profiles using HeII emission. The Te and ne profiles are used in extracting neutral densities from the Dα emissivities, and the radial electric field from the Doppler measurements. The behavior of Te(r), ne(r), 2nD(r), Er, and Vθ and their gradients can now be compared in detail to investigate the H-mode transition physics. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1323244
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  • 9
    Electronic Resource
    Electronic Resource
    Instrumentation for wide frequency range measurements of epoxy resin during microwave curing (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 1862-1868 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new instrumentation system for measuring wide frequency band complex permittivity (1 MHz–2 GHz) during the microwave curing process has been developed using an original system coupled with coaxial discontinuity. The instrumentation operates through the automatic commutation of the wide frequency band cell on a power supply or a probe supply. This system allows the use of different heating frequencies (215 MHz, 434 MHz, or 2.45 GHz) with the same cell. This instrumentation has been used to study microwave curing compared with conventional heating, but it can also be applied to the use of microwaves in chemical processes or to study the biological effects of microwaves. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1150548
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  • 10
    Electronic Resource
    Electronic Resource
    Dynamics of damped cantilevers (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 2772-2775 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: In atomic force microscopy cantilevers are used to detect forces caused by interactions between probing tip and sample. The minimum forces which can be detected with commercial sensors are typically in the range of 10−12 N. In the future, the aim will be to construct sensors with improved sensitivities to detect forces in the range of 10−18 N. These sensors could be used for mass spectroscopy or magnetic resonance force microscopy. Achieving this goal requires smaller sensors and increased quality factor Q. In this article we describe a model to characterize the dynamics of cantilevers of each eigenmode. In contrast to previous models, the damping is treated rigorously in the calculations. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1150690
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