ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Substrates of (11¯02) sapphire single crystals were covered with Y2O3 stabilized ZrO2 (YSZ) thin films deposited from 2,2,6,6 tetramethyl-3, 5-heptanedione precursors of Zr and Y by organometallic chemical vapor deposition. The YSZ layers were indeed oriented on the (100) planes as established by x-ray diffraction. Thin films of YBa2Cu3O7−x (YBCO) were then deposited on top of the YSZ layer by laser ablation. A critical temperature (R=0) of 90 K was obtained which is among the highest observed for YSZ. However, the critical current density at 77 K was only of the order of 103 A/cm2, which is common of polycrystalline YBCO deposited on YSZ.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.104668
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