Publication Date:
2012-05-01
Description:
Author(s): F. Wang, K. Shepperd, J. Hicks, M. S. Nevius, H. Tinkey, A. Tejeda, A. Taleb-Ibrahimi, F. Bertran, P. Le Fèvre, D. B. Torrance, P. N. First, W. A. de Heer, A. A. Zakharov, and E. H. Conrad In this work we use low-energy electron microscopy, x-ray photoemission electron microscopy, and x-ray photoelectron spectroscopy to study how the excess Si at the graphene-vacuum interface reorders itself at high temperatures. We show that silicon deposited at room temperature onto multilayer graph... [Phys. Rev. B 85, 165449] Published Mon Apr 30, 2012
Keywords:
Surface physics, nanoscale physics, low-dimensional systems
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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