ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
It is shown that P, Sb, and Ge ions implanted in SiO2 precipitate into spherical clusters of up to 1000 A(ring) diameter when heat treated in an oxygen-free ambient. This behavior is similar to that reported earlier for As implants. The clusters can be detected directly by transmission electron microscopy, or inferred from the unidirectional drift of the doped zone in a temperature gradient. Boron, a representative of group III, is the only element among those tested that does not migrate in a ∇T, suggesting the absence of phase separation.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.100664
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