ALBERT

All Library Books, journals and Electronic Records Telegrafenberg

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    Electronic Resource
    Electronic Resource
    EMPA measurements of magnetic microstructure in ultrathin films (invited) (abstract) : 35th annual conference on magnetism and magnetic materials (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 6096-6096 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Very little is currently known about domains and domain walls in ultrathin ferromagnetic films, i.e., films that are a few atomic layers to a few tens of layers thick. A major experimental difficulty is that these films must be grown and examined in situ with strict control over their atomic structure and elemental composition. Recently, scanning electron microscopy with polarization analysis (SEMPA) has been used to image domains in Fe1and Co2 films that were only a few monolayers thick. The structure and composition of the films were monitored during growth using RHEED (reflection high energy electron diffraction) and Auger electron spectroscopy. The magnetic structure of these films was then investigated in situ using SEMPA. SEMPA directly images the magnetization by measuring the spin polarization of secondary electrons emitted in the scanning electron microscope. This combination of surface sensitive techniques allows one to study the domain structure, anisotropy and magnetization of the films as a function of various growth parameters, such as, thickness, substrate roughness, and temperature.〈ks〉
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.347778
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    Tunable x-ray polarimeters for synchrotron radiation sources (1991)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 62 (1991), S. 2540-2544 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe the design and optical characteristics of a tunable x-ray polarimeter set up at the National Synchrotron Light Source at Brookhaven. Initially, the energy range from 7.0 to 9.2 keV is covered with a polarization extinction ratio greater than 10 000 and a statistically limited sensitivity of 70 μrad in measurements of optical rotary power. First spectroscopic measurements on a wide range of cobalt compounds show optical activity, Faraday rotation, and circular dichroism in the energy region close to the cobalt K edge. More recently we have worked on a variety of samples containing iron near the iron K edge.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1142523
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    Adaptive silicon monochromators for high power insertion devices: Tests at CHESS, ESRF, and HASYLAB (abstract) : Proceedings of the 5th international conference on synchrotron radiation instrumentation (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 2190-2190 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: X-ray wigglers which produce tens of kilowatts of photon power within the white beam will soon become available as third-generation sources of synchrotron radiation. Insertion devices that produce several kilowatts already exist and we have used those at CHESS, ESRF, and HASYLAB to test and develop an adaptive 111 silicon water jet-cooled monochromator at up to 2 kW total incident beam power. This development of earlier work at the Brookhaven National Synchrotron Light Source uses the pressure in the water coolant to provide active compensation of the strain field in the thermal footprint, nulling its effect to within residual variations in the Bragg angle of only a few seconds of arc. The design is robust, vacuum compatible, and uses no moving mechanical parts. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145702
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 4
    Electronic Resource
    Electronic Resource
    Line-broadening analysis of synchrotron x-ray diffraction data (1987)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 61 (1987), S. 2813-2816 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The advantages of using monochromatic and parallel synchrotron x rays for the microstructure analysis of polycrystalline materials have been studied. Analysis of line broadening from Pd powers showed encouraging results. Warren–Averbach analysis [J. Appl. Phys. 21, 595 (1950)] with respect to the three major crystal axes [111], [100], and [110] was done using 1-A(ring) x rays. Crystallite sizes and microstrains relative to the [111] direction were obtained using three different reflection pairs (111)-(222), (111)-(333), and (111)-(444). The fixed symmetrical instrument profile shape has major advantages in the correction of instrumental broadening and the determination of a low level (10−4 range) of stacking-fault probabilities.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.337872
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 5
    Electronic Resource
    Electronic Resource
    Double-tilt wide-aperture two-crystal monochromator for x-ray absorption spectroscopy (abstract) : INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION TSUKABA (JAPAN) 29 AUG−2 SEPT 1988 (1989)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 60 (1989), S. 2129-2129 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A water-cooled double-crystal monochromator for x-ray absorption spectroscopy is described. It has a wide aperture (3 mrad) and is attached to a linear slide through a twin axis goniometer to a large Huber rotary table for accurate alignment of the crystal planes to the incident beam. The center of rotation of the goniometers has been chosen as the geometric center at the surface of the first crystal. The linear slide adjusts the monochromator vertically so that the axis of rotation intercepts the synchrotron radiation. The two goniometers provide the monochromator with a transverse and longitudinal tilt with respect to the x-ray beam. Water cooling is incorporated in the first crystal to dissipate the expected heat loading of 120 W from the SRS wiggler. The second crystal is supported by three Inchworms which control the yaw and tilt. Then adjustments are required to optimize spectral purity across the beam alignment and harmonic rejection, respectively, with respect to the first crystal. The performance of the monochromator is discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1140849
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...