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  • 1985-1989  (57)
  • 1975-1979  (34)
  • 1960-1964  (7)
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  • 1
    Electronic Resource
    Electronic Resource
    Line-broadening analysis of synchrotron x-ray diffraction data (1987)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 61 (1987), S. 2813-2816 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The advantages of using monochromatic and parallel synchrotron x rays for the microstructure analysis of polycrystalline materials have been studied. Analysis of line broadening from Pd powers showed encouraging results. Warren–Averbach analysis [J. Appl. Phys. 21, 595 (1950)] with respect to the three major crystal axes [111], [100], and [110] was done using 1-A(ring) x rays. Crystallite sizes and microstrains relative to the [111] direction were obtained using three different reflection pairs (111)-(222), (111)-(333), and (111)-(444). The fixed symmetrical instrument profile shape has major advantages in the correction of instrumental broadening and the determination of a low level (10−4 range) of stacking-fault probabilities.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.337872
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  • 2
    Electronic Resource
    Electronic Resource
    Double-tilt wide-aperture two-crystal monochromator for x-ray absorption spectroscopy (abstract) : INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION TSUKABA (JAPAN) 29 AUG−2 SEPT 1988 (1989)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 60 (1989), S. 2129-2129 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A water-cooled double-crystal monochromator for x-ray absorption spectroscopy is described. It has a wide aperture (3 mrad) and is attached to a linear slide through a twin axis goniometer to a large Huber rotary table for accurate alignment of the crystal planes to the incident beam. The center of rotation of the goniometers has been chosen as the geometric center at the surface of the first crystal. The linear slide adjusts the monochromator vertically so that the axis of rotation intercepts the synchrotron radiation. The two goniometers provide the monochromator with a transverse and longitudinal tilt with respect to the x-ray beam. Water cooling is incorporated in the first crystal to dissipate the expected heat loading of 120 W from the SRS wiggler. The second crystal is supported by three Inchworms which control the yaw and tilt. Then adjustments are required to optimize spectral purity across the beam alignment and harmonic rejection, respectively, with respect to the first crystal. The performance of the monochromator is discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1140849
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  • 3
    Electronic Resource
    Electronic Resource
    Measurement of strain and lattice parameter in epitaxic layers (1975)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 8 (1975), S. 42-44 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A means of measuring strain and lattice parameter directly in epitaxic layers by `double-crystal' X-ray diffraction is presented. The method described has three major advantages; that it is achieved by a simple addition to a commercial goniometer; that the area of sample illuminated is defined solely by the collimator; and that single or double-crystal diffraction can be selected, simultaneously if needed, on exactly the same specimen area.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889875009491
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  • 4
    Electronic Resource
    Electronic Resource
    Synchrotron radiation – its application to high-speed, high-resolution X-ray diffraction topography (1975)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 8 (1975), S. 436-444 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: With almost perfect silicon crystals and cleaved lithium fluoride crystals as extreme examples, the feasibility of using synchrotron radiation for X-ray diffraction topography has been investigated. In both spatial resolution and strain resolution the synchrotron source diffraction topographs are competitive with topographs obtained using conventional X-ray sources but exposure times are reduced from several hours per cm2 to one second per cm2 using standard recording techniques with Ilford nuclear emulsions. Contrary to (the author's) expectations, the instrumentation required is far simpler for synchrotron radiation than for conventional sources.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S002188987501093X
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  • 5
    Electronic Resource
    Electronic Resource
    Harmonic-free single-crystal monochromators for neutrons and X-rays (1978)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 11 (1978), S. 248-253 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Comparisons are made between theoretical and actual performance of some novel crystal monochromators. Both perfect and slightly imperfect silicon crystals were used. It is demonstrated that with imperfect crystals and with an intensity loss of only 50% compared with a single perfect crystal, harmonic rejection ratios in excess of 1000 to one can be obtained. Calculations show harmonic rejection ratios of greater than 105 to one in perfect crystals.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889878013254
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  • 6
    Electronic Resource
    Electronic Resource
    High-energy double-crystal X-ray diffraction (1988)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 21 (1988), S. 516-520 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: High-energy double-crystal X-ray diffraction has previously only been demonstrated with radioactive sources. The advantages of very low absorption, no extinction and high resolution have been clearly demonstrated in a wide variety of experiments. The experiments reported here are the first to be performed with a high-energy X-ray tube providing radiation up to 160 keV. Mosaic spread has been studied by double-crystal rocking curves in silicon, germanium and calcium flouride in very thick samples. Mosaic spreads from 1′′ arc to several minutes of arc have been measured in 10 mm thick fluorite, in 25 mm thick germanium and in silicon. Routine non-destructive characterization of bulk crystalline materials is possible and many new opportunities will become available when high-energy storage rings make bright synchrotron radiation available in this part of the electromagnetic spectrum.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889888006120
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  • 7
    Electronic Resource
    Electronic Resource
    Synchrotron X-ray polycrystalline diffractometry (1986)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 19 (1986), S. 92-100 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Results using parallel-beam polycrystalline geometry at the Stanford Storage Ring are compared with conventional X-ray tube focusing. The PC-automated instrumentation included a pair of vertical-scan diffractometers for wavelength selection using a Si(111) channel monochromator and for powder specimens which may be measured in reflection or transmission. The dependence of intensity, profile shape, width and position on instrument parameters is described. All the profiles in patterns of well crystallized specimens with a selected receiving slit are symmetrical and primarily Gaussian with nearly the same width, thereby greatly simplifying the algorithms and programs for profile fitting and interpretation of profile broadening. The easy wavelength selection allows the use of a wavelength just longer than the absorption edge of elements in the sample to obtain maximum P/B ratio, and short wavelengths permit access to very high hkls. Because of the absence of the Kα doublet and the simple symmetrical profile shape the resolution need not be as good as in focusing geometry to achieve comparable overlap separation. The average precision of lattice-parameter determination was Δd/d = 5.6 × 10−5 using forward reflections.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889886089859
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  • 8
    Electronic Resource
    Electronic Resource
    Harmonic-free single-crystal monochromators for neutrons and X-rays (1979)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 12 (1979), S. 129-129 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: In Hart & Rodrigues [J. Appl. Cryst. (1978), 11, 248–253] equation (6) should read Ip(m + n)h(α) = ∫∞−∞ &Pgr;l = m + n − 1l = 0 R⊥ph(θ − lα)dθ + ∫∞−∞&Pgr;l = m + n − 1l = 0 R||ph(θ − lα)dθ. The equation given is correct for the double reflection case and therefore the error does not propagate in the paper.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889879011936
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  • 9
    Electronic Resource
    Electronic Resource
    Refinement of simple crystal structures from synchrotron radiation powder diffraction data (1987)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 20 (1987), S. 394-401 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: X-ray powder diffractometry with storage-ring radiation was used to test various aspects of a method for refining simple crystal structures (Si, CeO2 and Co3O4). Excellent powder patterns were obtained with 0.17° resolution parallel slits and 1 Å X-rays. The intensities were determined with a double-Gaussian profile-fitting function and used in the powder least-squares refinement program POWLS. Except for Si, the peaks were broadened because of small particle sizes. The R(Bragg) values were in the range 0.4–1.7%.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889887086412
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  • 10
    Electronic Resource
    Electronic Resource
    Crystal structures of quartz and magnesium germanate by profile analysis of synchrotron-radiation high-resolution powder data (1988)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 21 (1988), S. 182-191 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: High-resolution synchrotron-radiation powder data for quartz and Mg2GeO4, an olivine homologue, were obtained with a 365 mm long parallel-slit collimator with 0.05° aperture. The crystal structures were refined using a pseudo-Voigt profile fitting function and POWLS. Fourier maps were calculated from the measured structure factors of the germanate. The results for quartz were in good agreement with single-crystal data and R(Bragg) increased from 1.35 to 2.20% as the number of reflections included in the refinement increased from 46 to 119; the e.s.d.'s of the positional parameters were 4 to 8 × 10−4. The germanate gave R(Bragg) 4.85% using 77 Miller planes and the e.s.d.'s were 4 to 42 × 10−4. Special attention was given to the profile fitting function and the non-random particle distributions. The JCPDS Diffraction File Nos. will be reported in a later communication.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889887011567
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