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  • 1
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Outlined are design features of a versatile high-resolution two-axis diffractometer that is being constructed for operation at the Photon Factory as an Australian national facility. The instrument features optional use of multiple-imaging plates on a translating cassette to allow rapid recording of an almost complete range of data covering both the high-angle and small-angle scattering regime or alternatively the use of electronic detectors. The instrument will be capable of operation in various modes including the following: (i) high-resolution powder diffraction with single-channel counter and crystal analyzer, (ii) high-resolution, high-speed powder diffraction in the Debye–Scherrer mode with imaging plates as recording medium, either stationary or translating (for time-dependent studies), (iii) small-angle x-ray scattering with imaging plates as recording medium, (iv) protein crystallography in screenless Weissenberg mode, and (v) two- or three-axis single-crystal diffractometry. The salient features of the instrument are the use of a double-crystal sagittal focusing monochromator as primary monochromator together with the optional use of a condensing–collimating channel-cut (CCCC) monochromator or other channel-cut monochromator as secondary monochromator. The use of a CCCC monochromator enables fine tuning of beam position on sample, harmonic suppression, beam-condensation, and variation of wavelength bandpass. Further features include the use of high-precision incremental encoders on both axes, together with the capability of operating the whole diffractometer, including secondary monochromator and detectors, in vacuum of order 10−3 Torr in order to reduce absorption and parasitic scattering, and the use of a large camera radius (approximately 0.57 m) for the imaging plate cassette in order to increase angular resolution and signal to noise.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 49 (1993), S. 174-183 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: X-ray integrated intensities have been collected from extended-face specimens as a function of azimuthal angle ψ (rotation angle about the scattering vector) with a four-circle diffractometer for a number of semiconductor substrate materials and epitaxic layers. The Bragg reflections (and X-ray wavelengths) have been chosen so that as wide a range of asymmetry as possible is encompassed. It is shown that the interpretation of these results, in terms of kinematical and perfect-crystal dynamical X-ray diffraction theories, provides a measure of the perfection of the crystal being investigated. The interpretation of some results requires consideration of extinction effects and their dependence on asymmetry. Such measurements, taken from epitaxic layers or substrates beneath epitaxic layers, can also be used to determine the layer thickness and/or identify the composition of a layer.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 49 (1993), S. 655-661 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: For the case where the rotation axis of the monochromator crystal and that of the small specimen crystal are parallel, i.e. (+, −) or (−, +) configuration, the apparatus function in two-dimensional Δω, Δ2θ space is associated with the source, S, the monochromator crystal, M, and an idealized specimen crystal, c, which is vanishingly small and has zero mosaic spread. For any value of t (= tan θc/tan θM), the apparatus function is a product of the distributions (with their respective loci of translation) of: (i) the emissivity of S; (ii) the reflectivity over the length of M; (iii) the mosaic spread of M; and (iv) the wavelength band arising from the vector addition in Δω, Δ2θ space of the wavelength dispersion of M and of c. To combine the apparatus function with other components such as the mosaic spread of a real specimen crystal, its physical dimension, the size of the aperture in front of a quantum detector or the point-spread function of a position-sensitive detector, the appropriate mathematical operation in Δω, Δ2θ space is sequential convolution. Examples are given, for t = 0 (0.25) 1.0 (0.5) 2.0, of synthetic apparatus functions based on typical dimensions appropriate to neutron diffraction experimental arrangements. These are presented in Δω, Δ2θ(0) space, which corresponds to ω-scan data collection. The advantage of modifying these by affine transformation to Δω, Δ2θ(2) space or, equivalently, to correspond to ω–2θ-scan data collection, is demonstrated.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 50 (1994), S. 793-793 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: A typesetting error is corrected in the paper by Mathieson & Stevenson [Acta Cryst. (1993), A49, 655–661]. In the Abstract, the phrase `(+, −) or (−, +) configuration' should read `(+,−) or (+, +) configuration'.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 47 (1991), S. 128-133 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: X-ray diffraction studies of six samples of metal organic chemical vapour deposition (MOCVD)-grown Hg1−xCdxTe on novel GaAs substrates have been carried out. The six GaAs substrates have (311), (\overline 3\overline 1\overline 1), (511), (\overline 5\overline 1\overline 1), (711) and (\overline 7\overline 1\overline 1) orientations. The absolute polarities of the six substrates, initially unknown, have been determined by X-ray anomalous scattering (after the layers were deposited). The orientations and absolute polarities of the six Hg1−xCdxTe layers have similarly been determined and follow the substrates. An extensive set of integrated-intensity data has been collected from the (311) Hg1−xCdxTe layer, which is of the order of 1 μm in thickness. Least-squares analysis of these data yields information about the thermal vibrations of the atomic species, extinction effects and the average composition of the Hg1−xCdxTe layer. Some results of double-crystal rocking-curve measurements for each of the six samples are also reported. The Rutherford backscattering of 2 MeV He ions has been used to determine independently the absolute polarity, composition and quality of the (311) and (\overline 3\overline 1\overline 1) Hg1−xCdxTe layers.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 50 (1994), S. 621-632 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Accurate X-ray integrated-intensity data collected from an extended-face crystal of GaAs are analysed to provide detailed information on the thermal vibrations of atomic species, including cubic anharmonicity, at room temperature. The values obtained for the thermal parameters are BGa = 0.622 (3) Å2, BAs = 0.483 (5) Å2 and βGaAs = −0.6 (1) × 10−18 J Å−3 (defined in the text). The inclusion of cubic anharmonic thermal vibrations is shown to be highly significant. In order to interpret the data collected for certain low-angle Bragg reflections for which h + k + l = 4n + 2 (in particular, 200, 222 and 222), it is necessary to consider bonding effects. It is shown that there is a net transfer of electron charge from gallium to arsenic [Q = 0.12 (3) e] and that the inclusion of bonding effects in the least-squares analysis is highly significant. The analysis includes allowance for the extremely severe extinction effects present for such a perfect sample (minimum extinction factor 0.286). The refined value of the mean radius of perfect-crystal domains is 4.6 (2) μm. The final fit, for 153 independent Bragg reflections, is excellent, as indicated by the weighted R-factor of 0.683% and the goodness-of-fit parameter of 1.083. The results of the least-squares analysis are compared for the cases of relativistic Hartree–Fock, Thomas–Fermi–Dirac and relativistic Dirac–Slater atomic scattering factors, the former being favoured.
    Type of Medium: Electronic Resource
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  • 7
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: CdTe and HgCdTe epitaxial layers were grown on 50 mm diameter (100) GaAs wafers in a Quantax 226 metallo-organic chemical vapour deposition system. Dimethylcadmium, diethyl telluride and elemental mercury were used as starting materials in the thermal growth process which takes place in a flow of hydrogen at 250-350°C. The layers were characterized by (1) an interference contrast microscope for surface morphology; (2) FTIR spectros-copy for compositional and thickness uniformity; (3) x-ray topography and double crystal diffractometry for the non-destructive evaluation of the crystalline quality and microstructure; (4) energy-dispersive x-ray analysis (WDX/EDX) for compositional studies; (5) transmission electron microscopy for interface observations and analysis; and (6) Rutherford backscattering and channelling analysis for surface stoichiometry and crystal quality determinations.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
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  • 8
    Publication Date: 1992-01-01
    Print ISSN: 0034-6748
    Electronic ISSN: 1089-7623
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
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  • 9
    Publication Date: 1993-08-21
    Print ISSN: 0108-7673
    Electronic ISSN: 2053-2733
    Topics: Chemistry and Pharmacology , Geosciences , Physics
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  • 10
    Publication Date: 1994-11-01
    Print ISSN: 0108-7673
    Electronic ISSN: 2053-2733
    Topics: Chemistry and Pharmacology , Geosciences , Physics
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