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  • 1
    Electronic Resource
    Electronic Resource
    Intermittency driven by band-limited noise (1993)
    Springer
    The European physical journal 90 (1993), S. 107-116 
    Details
    ISSN: 1434-6036
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Nonlinear systems driven by band-limited noise exhibit intermittent dynamics over a wide frequency domain, as revealed by high-pass filtering the system response at a cut-on frequency much higher than the noise cut-off frequency. The statistics of the stationary intermittency thus developed is investigated in detail by analogue simulation of a simple monostable system, the overdamped quartic oscillator, in the limit of strong nonlinearity. The mathematical interpretation of our results is provided in terms of a statistically refined singular-perturbation argument, which explains the occurrence of an intermittent burst in the high-pass filtered signal with the close coincidence of a signal inflection point with a noise zero-crossing. Our interest focuses on a characteristic frequency domain, where the intermittent phenomenon is sensitive to the nonlinear nature of the system, only, irrespective of the driving noise statistics (inertial range).
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01321041
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  • 2
    Electronic Resource
    Electronic Resource
    A core level electron energy loss study of the PD-SI(111) 2× 1 interface formation (1991)
    Springer
    Il nuovo cimento della Società Italiana di Fisica 13 (1991), S. 203-210 
    Details
    ISSN: 0392-6737
    Keywords: Radiation damage and other structure irradiation effects
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Summary The structural and surface sensitivity of electron energy loss spectroscopy has been exploited to investigate the Pd-Si(111) 2×1 interface. We found the twoM iv,v shallow edges of Pd suitable for an EELS study on the whole coverage range. EXAFSlike oscillations were detectable above theM iv,v edge for about 150 eV. These features together with the intensity ratio (M v/M iv) between theM v andM iv components showed a reproducible dependencevs. the thickness of the Pd film. From the analysis of the near edge part and the EXAFSlike oscillations a general indication of the formation of a compound very close to Pd2Si in the coverage range (5÷20) Å and the presence of a peculiar Pd−Si compound at coverages lower than 5 Å was obtained.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF02463997
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  • 3
    Electronic Resource
    Electronic Resource
    Stochastic resonance in paramagnetic resonance systems (1993)
    Springer
    Journal of statistical physics 70 (1993), S. 425-435 
    Details
    ISSN: 1572-9613
    Keywords: Noise ; magnetic resonance ; nonlinear effects
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Experimental evidence of the stochastic resonance phenomenon in an electron paramagnetic resonance (EPR) system is reported. The amplitude and phase response of the EPR system operating in bistable conditions are measured for increasing values of the noise intensity. Theoretical predictions based on a simple dynamical model for the relevant system observables are shown to be in good agreement with experimental results.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01053979
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  • 4
    Electronic Resource
    Electronic Resource
    Electronic structure of Cr clusters on graphite (1991)
    Springer
    The European physical journal 20 (1991), S. 387-390 
    Details
    ISSN: 1434-6079
    Keywords: 79.20 ; 73.20 ; 36.40
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The electronic structure of small chromium clusters deposited by evaporation onto clean polycrystalline graphite has been studied by means of Auger, X-ray Photoemission (XPS) and Electron Energy Loss (EELS) spectroscopies. The XPS results show an increase in the binding energy of both core levels and valence band reducing the cluster size. The EELS measurements show a variation of the intensity ratio of L3-to-L2 ionization core edges. We interpret this change as due to different redistribution, within the clusterd-band, of the empty states above the Fermi level. As a consequence the XPS results may also be attributed to sizeable change of the electronic structure of the small clusters.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01544018
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  • 5
    Electronic Resource
    Electronic Resource
    XPS, AES and EELS studies of Cr clusters on graphite (1993)
    Springer
    The European physical journal 26 (1993), S. 51-53 
    Details
    ISSN: 1434-6079
    Keywords: 79.20.Hx ; 79.60.−i ; 36.40.+d
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The electronic structure of small chromium clusters deposited by evaporation onto clean polycrystalline graphite has been studied by means of the Electron Energy Loss (EELS), Auger and X-ray photoemission (XPS) spectroscopies. The XPS results show an increase of the binding energy of both core levels and 3d valence band states when the cluster size decreases. The analysis of the Auger spectra by the Cini-Sawatzky theory suggests that the electronic screening properties do not change in small clusters with respect to the bulk. The EELS spectra indicate an increase of the energy loss features due to the interband transitions between 3d full states andsp empty states when the cluster size decreases. These observations are attributed to sizeable changes occurring in the electronic structure of the clusters.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01425615
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  • 6
    Electronic Resource
    Electronic Resource
    Structural characterization of supported chromium clusters by extended energy-loss fine structure (1990)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 16 (1990), S. 14-17 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The lattice parameters of chromium clusters deposited on carbon substrates were determined by extended energy-loss fine structure (EXELFS) measurements in transmission mode beyond the L2, 3 edges of chromium using an electron microscope. Fourier analysis of the data shows a sizeable lattice parameter contraction when the mean diameter of the clusters decreases. This contraction amounts to ∼5.2% with respect to the bulk value for those clusters with a mean volumetric diameter of ∼13 Å. The behaviour of the nearest-neighbour-distance contraction versus cluster diameter agreed with a macroscopic liquid-drop model.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740160106
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  • 7
    Electronic Resource
    Electronic Resource
    Surface stoichiometry determination of SiOxNy thin films by means of XPS (1994)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 22 (1994), S. 190-192 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The surface stoichiometry of SiOxNy thin films has been studied by means of x-ray photoelectron spectroscopy (XPS). The modified Auger parameter, applied on the Si 2p core level and Si KL2,3L2,3 Auger signal, has been used to calculate the surface composition of SiOxNy thin films prepared using different methods. The results have been compared with those obtained calculating the area under the XPS peaks and the Rutherford backscattering spectroscopy. The good agreement between these data indicates the validity of the modified Auger parameter as an easy and fast method, available in all electron spectroscopy laboratory, to study the surface stoichiometry of Si-based compounds.
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740220142
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  • 8
    Electronic Resource
    Electronic Resource
    Structural and electronic studies of clean and oxidized thin Fe films on polycrystalline copper (1992)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 18 (1992), S. 98-102 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The local structure of very thin films of iron, deposited in an ultrahigh vacuum (UHV) onto polycrystalline copper and submitted to oxidation and thermal treatments, has been studied by surface electron energy-loss fine structure (SEELFS) spectroscopy in reflection mode beyond the L2,3-edges of iron and the K-edge of oxygen. These results have been correlated to x-ray photoemission (XPS) measurements performed on the same samples. Our results can be summarized as follows: lowering of the lattice parameter of the iron deposit, supporting the hypothesis of a cluster growth; selectivity toward the oxidation process of the iron deposits with respect to the copper substrate; restoring the metallic behaviour of the iron deposit after thermal treatment.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740180206
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  • 9
    Electronic Resource
    Electronic Resource
    Extended energy loss fine structure and x-ray photoelectron spectroscopy studies of clean and oxidized Fe thin films on polycrystalline Cu (1992)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 19 (1992), S. 478-482 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The electronic and structural properties of very thin iron films deposited in ultrahigh vacuum on polycrstalline copper have been studied by x-ray photoemission and Auger spectroscopies and the extended energy loss fine structure technique beyond the L2, 3 edges of iron. Shifts in both core level and valence band binding energies together with a decrease in nearest-neighbour distance are consistent with a cluster growth picture. Successive oxidation and thermal treatments have shown a selectivity towards oxidation of the iron deposits with respect to the copper substrate and a restoration of the cleanness of the iron deposit after thermal treatment.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740190190
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  • 10
    Electronic Resource
    Electronic Resource
    SiOx surface stoichiometry by XPS: A comparison of various methods (1994)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 22 (1994), S. 89-92 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The surface stoichiometry of SiOx thin films (x = 1,…, 2) has been determined by means of x-ray photoelectron spectroscopy using: (a) two well established methods involving the determination of the area of the O 1s and Si 2p core level peaks and the analysis of the Si 2p line shape, respectively, and (b) the method of the modified Auger parameter recently suggested. The agreement between the different approaches for determination of the stoichiometry of the films indicates the modified Auger parameter procedure as an easy, fast and very reliable method to ascertain the surface stoichiometry of SiOx films.
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740220122
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