ISSN:
1573-0727
Keywords:
Built-in self-test
;
compaction testing
;
parity testing
;
signature analysis
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
Notes:
Abstract A generalized testing technique called constrained parity testing is presented for detecting multiple stuck-at faults in any single-output irredundant combinational network by verifying the subparities of the network. Implementation independent testability conditions are established for single- and multiple-input stuck-at faults. A spanning parity signature (SPS) is introduced to detect vacuous faults, which include all the input stuck-at faults and a majority of all other multiple stuck-at faults. The SPS is considered for testing all stuck-at faults in networks with small numbers of fanout lines, and a method of deriving tests for nonvacuous faults is proposed. For networks with large fanouts, a hybrid scheme by combining with syndrome testing is suggested to eliminate or reduce the need for expensive fault simulation. The proposed technique is a theoretical generalization of many existing methods and offers advantages such as versatility, flexibility, low test volume, low test time, high fault coverage, and reduced fault simulation and test generation costs.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00135443
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