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  • Articles  (199)
  • 1990-1994  (199)
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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 1968-1971 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: An attempt has been made to identify the optimum parameters for good dielectric resonator materials. The dependence of dielectric constant of the system BaLn2Ti4O12 (Ln=La, Pr, Nd, Sm) on packing fraction and nephelauxetic ratio is discussed. The reported dielectric data for this system were treated using the multiregression method.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 945-954 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The anomalies of the second-, third-, and fourth-order elastic constants have been derived for barium titanate and related compounds for the phase transition from cubic to tetragonal and from the tetragonal to the orthorhombic phases. The equilibrium values of the three components of the order parameter and the strain variables in the two phases have been obtained from the stability conditions. The fluctuations in the order parameter in the two phases have been derived from the Landau–Khalatnikov equations. Expressions have been given for the shift in the zero point energy in the tetragonal and orthorhombic phases, and these are shown to be proportional to (T−Tc)2. The anomalies for all the second-order elastic constants have been derived for both phases, and relations among them have been reported. It is shown that the elastic anomalies suffer a discontinuity at the transition temperature for both the phases. Our expressions give the temperature variation of the third-order elastic and fourth-order elastic constants for the phase transition from the tetragonal to the orthorhombic phase.
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 4053-4055 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Microwave dielectric parameters are measured for lithium-zinc ferrites with chemical formula Li0.5−x/2Fe2.5−x/2ZnxO4 (x=0.0, 0.1, 0.3, 0.5, 0.6). All the samples except x=0.5, show an increase in the dielectric loss with temperature. A relaxation-type mechanism is observed for x=0.5. The results are compared with the low-frequency dielectric constant and loss.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 92 (1990), S. 3170-3178 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Functional sensitivity analysis is used to study the effect of potential structure upon the elastic scattering of He atoms from a one-dimensional surface. The calculations are implemented by computing the total scattering wave functions from a wave packet calculation by a Møller wave operator method. The functional sensitivities of the various diffraction probabilities for several angles of incidence and surface corrugation are studied. The method is extended to examine the role of potential structure for a surface with adsorbed impurities. It was observed that the various diffraction processes draw from local regions of the potential in very different ways. At high angles of incidence for back scattering and particularly for strong surface corrugation, the large protruding portions of the surface cast a "shadow'' of lower dynamical sensitivity. Results of this type should ultimately be insightful for the inversion of experimental data to obtain the interaction potential.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 3930-3935 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A methyl radical source has been developed for use in high vacuum. Methyl radicals are produced through azomethane pyrolysis in a tubular reactor located inside an ultrahigh vacuum chamber. Other gas products include nitrogen from azomethane pyrolysis, and methane, ethane plus hydrogen from the reactions of methyl radicals on the walls of the reactor. Methyl yields as high as 42% have been observed.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 3025-3027 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An automated ferroelectric hysteresis loop tracer, developed using an INTEL 8085 microprocessor is described. This setup can be used to study the growth of a hysteresis curve at any desired temperature instantaneously after the application of a field. Since the setup allows the storage of data for each cycle of the applied field, this can be used to study the response of ferroelectric domains in an applied alternating field with time on unpoled or poled samples. The setup is interfaced with a personal computer to obtain directly the values of loop parameters.
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 6161-6161 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Commercial perfluoro poly ethers (PFPE) are available with different backbone structures and end groups and are being used as lubricants for particulate/thin film disks. Very little published information is available other than F-19 spectra for these polymers.1 In this abstract a systematic study was undertaken to study the structure of these PFPE polymers using multinuclear magnetic resonance (NMR). Backbone structural differences of Z. Fomblin, Y. Fomblin, Krytox, and Demnums could be clearly seen from F-19 NMR studies. Number average molecular weight of PFPE polymers was also determined from F-19 NMR and found to be between 2000 and 10 000. C-13 NMR was used to differentiate the end group from backbone structure. Associated proton test (APT) was used to distinguish the primary, secondary, and tertiary carbons. The proton connectivity of end group (e.g., Fomblin AM2001) was studied by two dimensional (2D) proton correlation spectroscopy (COSY). The connectivity of a hydrogen containing end group to the backbone was studied by heteronuclear shift correlation spectroscopy (HCORR). Even though these PFPE polymers have low vapor pressure, a significant amount of lube loss is found over a period of time under HDA (head disk assembly) conditions.The temperature could increase from 25 to 60 °C. Additionally under certain asperity/head interaction conditions the temperature variation could be as high as 300 °C to 500 °C. It is also reported that functionalized polymeric materials (e.g., Krytox 143 AC) can be bonded to magnetic disk surface by applying heat. The effect of temperature on lubricant volatility/stability was studied for AM 2001. The molecular weight of heat treated AM 2001 (90 min at 130 °C) changed from 2100 to 4500. This could be due to preferential volatilization of low molecular weight fragments. NMR analysis showed significant conversion of piperonyl end group to -CH2OH. Thus AM 2001 is not thermally stable. Precipitation was also found to occur when AM 2001 is stored over a period of time. The precipitate is found to be a derivative of 9,10 dihydroanthracene. Unlike other PFPE polymers AM 2001 is found to be sparingly soluble in dichloromethane (contrary to the claim by the manufacturer that it is soluble only in fluorinated solvents) and hence more polar than Fomblin Z-Dol.
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  • 8
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Environmental science & technology 26 (1992), S. 650-652 
    ISSN: 1520-5851
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Energy, Environment Protection, Nuclear Power Engineering
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 60 (1992), S. 222-224 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This letter reports a novel analytical method using negative secondary ion mass spectrometry (SIMS) of the Te matrix element with a Cs primary ion beam to analyze and determine the composition in HgCdTe epilayers with a high sensitivity (better than Δx of 0.0015) and a depth resolution determined by SIMS. The method is based on matrix-induced ion yield variations in the Te signal observed in SIMS. The correlation between the Te− secondary ion yield and Cd mole fraction is a linear function. The material composition can be calculated by this technique when the Te yield profile is known provided that the composition of any two layers of the structure are known, or the structure contains a CdTe layer, for which case composition of no Hg1−xCdxTe layer is needed.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 59 (1991), S. 1908-1910 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Highly c-axis oriented good-quality (Tc of 88 K and Jc of 105 A/cm2 at 20 K) thin films of Y1Ba2Cu3O7−δ have been deposited on stainless-steel substrates by an in situ all-laser process involving use of laser-deposited Y-ZrO2-Ag composite film as a barrier layer. These results are compared with those obtained for the case of the use of a bilayer configuration of Ag and Y-ZrO2 to emphasize the importance of employing a composite film as a barrier layer.
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