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  • OPTICS  (15)
  • 1990-1994  (15)
  • 1
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    Narrow band solar images in the soft X-ray regime with multilayer optics (1992)
    In:  Other Sources
    Details
    Publication Date: 2011-08-24
    Description: High quality multilayers with 2d spacings as short as about 44 A have been used successfully for astronomical observations. Observation of both the sun and cosmic X-ray sources (for which radiation longward of the carbon edge at about 44 A is strongly attenuated by interstellar matter) are possible at wavelengths shorter than 40 A with current multilayer technology, if mirrors are used at nonnormal angles of incidence. We discuss several configurations which are suitable for high resolution solar imaging observations in the wavelength interval between 0.5 and 50 A. We also describe the design and anticipated performance of a multilayer optical system we are currently developing for a rocketborne solar observatory.
    Keywords: OPTICS
    Type: In: Multilayer and grazing incidence X-ray(EUV optics; Proceedings of the Meeting, San Diego, CA, July 22-24, 1991 (A93-39658 15-74); p. 345-352.
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  • 2
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    Metrology of X-ray optics utilizing shearing interferometric techniques (1992)
    In:  Other Sources
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    Publication Date: 2011-08-24
    Description: This paper will discuss the optical testing of extreme grazing incidence mirror systems and normal incidence high-precision mirror systems during fabrication processing of the optical substrates. The optical metrology is closely coupled with an advanced material removal process which will be discussed in terms of the optical metrology. Interferometric data will be presented of the optical surfaces. Surface roughness data will be shown and discussed.
    Keywords: OPTICS
    Type: In: Multilayer and grazing incidence X-ray(EUV optics; Proceedings of the Meeting, San Diego, CA, July 22-24, 1991 (A93-39658 15-74); p. 137-147.
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  • 3
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    Ultrahigh resolution photographic films for X-ray/EUV/FUV astronomy (1993)
    In:  Other Sources
    Details
    Publication Date: 2011-08-24
    Description: The quest for ultrahigh resolution full-disk images of the sun at soft X-ray/EUV/FUV wavelengths has increased the demand for photographic films with broad spectral sensitivity, high spatial resolution, and wide dynamic range. These requirements were made more stringent by the recent development of multilayer telescopes and coronagraphs capable of operating at normal incidence at soft X-ray/EUV wavelengths. Photographic films are the only detectors now available with the information storage capacity and dynamic range such as is required for recording images of the solar disk and corona simultaneously with sub arc second spatial resolution. During the Stanford/MSFC/LLNL Rocket X-Ray Spectroheliograph and Multi-Spectral Solar Telescope Array (MSSTA) programs, we utilized photographic films to obtain high resolution full-disk images of the sun at selected soft X-ray/EUV/FUV wavelengths. In order to calibrate our instrumentation for quantitative analysis of our solar data and to select the best emulsions and processing conditions for the MSSTA reflight, we recently tested several photographic films. These studies were carried out at the NIST SURF II synchrotron and the Stanford Synchrotron Radiation Laboratory. In this paper, we provide the results of those investigations.
    Keywords: OPTICS
    Type: In: Multilayer and grazing incidence X-ray(EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, July 19-22, 1992 (A93-39601 15-74); p. 549-561.
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  • 4
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    Design and analysis of aspherical multilayer imaging X-ray microscope (1991)
    In:  Other Sources
    Details
    Publication Date: 2011-08-19
    Description: Spherical Schwarzschild microscopes for soft X-ray applications in microscopy and projection lithography employ two concentric spherical mirrors that are configured such that the third-order spherical aberration and coma are zero. Based on incoherent, sine-wave MTF calculations, the object-plane resolution of a magnification-factor-20 microscope is presently analyzed as a function of object height and numerical aperture of the primary for several spherical Schwarzschild, conic, and aspherical two-mirror microscope configurations.
    Keywords: OPTICS
    Type: Optical Engineering (ISSN 0091-3286); 30; 1094-109
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  • 5
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    X-ray monochromator (1992)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Description: An x-ray monochromator is described, wherin a housing supports a plurality of mirrors forming a plurality of opposed mirror faces in parallel with each other and having thereon multilayer coatings, with each of said pairs of mirror faces being provided with identical coatings which are different from the coatings on the other pairs of mirror faces such that each pair of mirror faces has a peak x-ray reflection at a different wavelength regime. The housing is moveable to bring into a polychromatic x-ray beam that pair of mirror faces having the best x-ray reflection for the desired wavelength, with the mirrors being pivotable to move the mirror faces to that angle of incidence at which the peak reflectivity of the desired wavelength x-rays occurs.
    Keywords: OPTICS
    Format: application/pdf
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  • 6
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    Optical configurations of H I Lyman-alpha coronagraph/polarimeters (1992)
    In:  Other Sources
    Details
    Publication Date: 2019-06-28
    Description: The Multi-Spectral Solar Telescope Array (MSSTA) has obtained numerous high-resolution soft X-ray/EUV/FUV solar images with multilayer telescopes; these show dramatic prominences, spicules, and threadlike limb structures. There is excellent correlation between faint Lyman-alpha coronal structures seen in the digitized MSSTA images and prominences seen in H-alpha images gathered by ground-based observatories. The MSSTA has established the feasibility of an all-reflecting, imaging Ly-alpha coronagraph/polarimeter.
    Keywords: OPTICS
    Type: In: Multilayer and grazing incidence X-ray(EUV optics; Proceedings of the Meeting, San Diego, CA, July 22-24, 1991 (A93-39658 15-74); p. 414-431.
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  • 7
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    Multilayer and grazing incidence X-ray/EUV optics; Proceedings of the Meeting, San Diego, CA, July 22-24, 1991 (1992)
    In:  Other Sources
    Details
    Publication Date: 2019-07-13
    Description: The present conference discusses the Advanced X-ray Astrophysics Facility (AXAF) calibration by means of synchrotron radiation and its X-ray reflectivity, X-ray scattering measurements from thin-foil X-ray mirrors, lobster-eye X-ray optics using microchannel plates, space-based interferometry at EUV and soft X-ray wavelengths, a water-window imaging X-ray telescope, a graded d-spacing multilayer telescope for high energy X-ray astronomy, photographic films for the multispectral solar telescope array, a soft X-ray ion chamber, and the development of hard X-ray optics. Also discussed are X-ray spectroscopy with multilayered optics, a slit aperture for monitoring X-ray experiments, an objective double-crystal spectrometer, a Ly-alpha coronagraph/polarimeter, tungsten/boron nitride multilayers for XUV optical applications, the evaluation of reflectors for soft X-ray optics, the manufacture of elastically bent crystals and multilayer mirrors, and selective photodevices for the VUV.
    Keywords: OPTICS
    Type: SPIE-1546 , ; 648 p.
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  • 8
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    Multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, July 19-22, 1992 (1993)
    In:  Other Sources
    Details
    Publication Date: 2019-07-13
    Description: The present volume on multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography discusses AXAF grazing incidence mirrors, the theory and high throughput optics of grazing incidence optics, multilayer mirror fabrication and characterization, and multilayer optics for X-ray projection lithography. Attention is given to the VETA-I X-ray detection system, a motion detection system for AXAF X-ray ground testing, image analysis of the AXAF VETA-I X-ray mirror, and optical constants from mirror reflectivities measured at synchrotrons. Topics discussed include the application of aberration theory to calculate encircled energy of Wolter I-II telescopes, W/C multilayers deposited on plastic films, nonspecular X-ray scattering from Si/Mo multilayers, and multilayer thin-film design as FUV polarizers. Also discussed are thin-film filter lifetesting results in the EUV, chromospheric and coronal observations with multilayer optics, present and future requirements of soft X-ray projection lithography, and the imaging Schwarzschild multilayer X-ray microscope.
    Keywords: OPTICS
    Type: SPIE-1742 , ; 715 p.
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  • 9
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    Design of narrow band XUV and EUV coronagraphs using multilayer optics (1991)
    In:  Other Sources
    Details
    Publication Date: 2019-07-13
    Description: A novel approach to the study of the solar corona is described, which enables observation of the soft X-ray (XUV), EUV, and FUV emission of the highly ionized ions present in the corona. The principal advantage of this approach is a relatively low contrast between the innner corona and the solar disk at the wavelengths involved; the contrast between coronal visible light and the XUV or EUV light is about 1. The design and the anticipated performances of the XUV and EUV coronagraphs using normal incidence multilayer optics are described.
    Keywords: OPTICS
    Type: X-ray/EUV Optics for Astronomy, Microscopy, Polarimetry and Projection Lithography; Jul 09, 1990 - Jul 13, 1990; San Diego, CA; United States
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  • 10
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    X-ray/EUV optics for astronomy, microscopy, polarimetry, and projection lithography; Proceedings of the Meeting, San Diego, CA, July 9-13, 1990 (1991)
    In:  Other Sources
    Details
    Publication Date: 2019-07-13
    Description: Topics discussed in this issue include the fabrication of multilayer X-ray/EUV coatings; the design, characterization, and test of multilayer X-ray/EUV coatings; multilayer X-ray/EUV monochromators and imaging microscopes; X-ray/EUV telescopes; the test and calibration performance of X-ray/EUV instruments; XUV/soft X-ray projection lithography; X-ray/EUV space observatories and missions; X-ray/EUV telescopes for solar research; X-ray/EUV polarimetry; X-ray/EUV spectrographs; and X-ray/EUV filters and gratings. Papers are presented on the deposition-controlled uniformity of multilayer mirrors, interfaces in Mo/Si multilayers, the design and analysis of an aspherical multilayer imaging X-ray microscope, recent developments in the production of thin X-ray reflecting foils, and the ultraprecise scanning technology. Consideration is also given to an active sun telescope array, the fabrication and performance at 1.33 nm of a 0.24-micron-period multilayer grating, a cylindrical proportional counter for X-ray polarimetry, and the design and analysis of the reflection grating arrays for the X-Ray Multi-Mirror Mission.
    Keywords: OPTICS
    Type: SPIE-1343 , X-ray/EUV Optics for Astronomy, Microscopy, Polarimetry and Projection Lithography; Jul 09, 1990 - Jul 13, 1990; San Diego, CA; United States
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