ALBERT

All Library Books, journals and Electronic Records Telegrafenberg

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
Filter
  • Articles  (117)
  • 1990-1994  (117)
Collection
Source
Keywords
Publisher
Years
Year
Journal
Topic
  • 1
    Electronic Resource
    Electronic Resource
    Electron optical characterization of cubic boron nitride thin films prepared by reactive ion plating (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 70 (1991), S. 3007-3012 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Boron nitride films prepared by reactive ion plating from a boron evaporation source were characterized structurally using three independent electron optical techniques: energy filtered electron diffraction with radial distribution function analysis; electron energy-loss spectroscopy of the near-edge structure of the boron K edge; and spectroscopy of the plasmon region of the energy-loss spectrum. Both specimens had a graded BNx layer between the BN layer and the silicon substrate and in addition one specimen had a titanium bonding layer underneath the BNx layer. The presence of c-BN in both specimens was confirmed by all techniques. The specimen with the titanium bonding layer was examined in cross section and showed essentially pure c-BN on the surface. A model for the formation of c-BN assisted by the compressive stress generated during deposition is proposed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.349330
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    A compact interferometer using moire effect for the phase compensation (1992)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 3856-3861 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A compact interferometer using a grating beamsplitter is reported. The phase of the interference signal was adjusted by using the moire effect of the gratings, so that a small optical path difference was compensated precisely by the magnified displacement of the grating. The optical system was analyzed theoretically on the basis of the Fourier optics. For the interferometric measurement in the microscopic region, a compact optical system was assembled from the microscopic objective and the 25-μm gratings. The characteristics of the proposed interferometer were investigated in the measurements of film thickness, piezoelectric vibration, and photoacoustic effect.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1143283
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    Dynamic mode force microscopy for the detection of lateral and vertical electrostatic forces (1993)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 63 (1993), S. 2573-2575 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In this letter, a variant of scanning force microscope for detecting attractive forces is reported. The force gradients of the attractive forces acting in two orthogonal directions were detected simultaneously from the resonant frequency shifts of a cantilever oscillating in two directions. Using the fine electrode sample, the distributions of the electrostatic forces acting in lateral and vertical directions were visualized separately.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.110437
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 4
    Electronic Resource
    Electronic Resource
    Improved microscratch hardness of ion-plated carbon film by nitrogen inclusion evaluated by atomic force microscope (1994)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 65 (1994), S. 3206-3208 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Nitrogen-containing carbon films where deposited by reactive ion plating under a pure nitrogen ambient. Knoop hardness, microindentation hardness, and microscratch hardness of these films were evaluated. Indentation hardness, such as Knoop hardness and microindentation hardness, is influenced by surface roughness and substrate hardness, so the effect of nitrogen inclusion on the hardness cannot be clearly evaluated. In contrast, an atomic force microscope can clearly evaluate the effect of nitrogen inclusion on scratched wear depth. © 1994 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.112414
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 5
    Electronic Resource
    Electronic Resource
    Photoluminescence of porous Si, oxidized then deoxidized chemically (1992)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 61 (1992), S. 46-48 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We examined the change in photoluminescence spectra of porous Si when it is oxidized then deoxidized chemically. After both steps, photoluminescence shifted to higher frequencies and increased in intensity. These shifts to higher frequencies indicate the photoluminescence is a result of the quantum size effect. Moreover, the increase in photoluminescence intensity after oxidation suggests that termination by hydrogen on the porous Si surface does not always play a key role in the photoluminescence mechanism.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.107663
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 6
    Electronic Resource
    Electronic Resource
    Higher-order solution of an ion-acoustic solitary wave in a plasma (1993)
    New York, NY : American Institute of Physics (AIP)
    Physics of Fluids 5 (1993), S. 409-414 
    Details
    ISSN: 1089-7666
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A simple method for obtaining higher-order solutions of a solitary wave is presented. The method is based on the higher-order approximation of the reductive perturbation method. As a model equation, the Korteweg–de Vries (KdV) equation with fifth-order dispersion term is employed and higher-order solutions are obtained. In the case of ion-acoustic solitary wave, the fourth-order solution is given explicitly and is compared with numerical solutions. The fourth-order solution is shown to be valid if a normalized wave amplitude is less than 0.5.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.860526
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 7
    Electronic Resource
    Electronic Resource
    Long-time diffusion in plasma turbulence with broad uniform spectrum (1993)
    New York, NY : American Institute of Physics (AIP)
    Physics of Fluids 5 (1993), S. 2786-2792 
    Details
    ISSN: 1089-7666
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The long-time behavior of charged particles in plasma turbulence with uniform broad wave spectrum is studied numerically. The diffusivity of the particle velocity distribution is characterized by the quasilinear nature for extended time, while a transient diffusion precedes with the enhanced nonquasilinear diffusion rate when resonance overlapping is relatively weak. The observed long-time quasilinear diffusion coefficient eventually decreases due to the finiteness of the resonance region. The transient-type diffusion is revealed only by the higher-order numerical calculation.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.860667
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 8
    Electronic Resource
    Electronic Resource
    Electrochemical observation of instabilities of the Belousov-Zhabotinskii reaction in CSTR (1994)
    Springer
    Journal of applied electrochemistry 24 (1994), S. 647-651 
    Details
    ISSN: 1572-8838
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Electrical Engineering, Measurement and Control Technology
    Notes: Abstract The instabilities of the Belousov-Zhabotinskii reaction were studied in an isothermal CSTR by varying the space velocity as bifurcation parameter. The time-dependent concentration of bromide ion and redox potential were observed, respectively, by a Ag-AgBr electrode and a platinum-wire electrode under reaction-controlling conditions. The single-peak periodic and the chaotic oscillations occur alternately with increasing space velocity. The multipeak oscillations were also observed at higher space velocities. Two kinds of chaotic oscillations were observed, chaotic oscillations with amplitudes varying irregularly in the periodic-chaotic sequence region and chaotic mixing of large and small amplitude in the multipeak oscillations region. An analysis of the phase portraits for these chaotic oscillations indicates that they correspond to low dimensional and fractal structures.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00252090
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 9
    Electronic Resource
    Electronic Resource
    Nonlinear processes in UV optical materials at 248 nm (1990)
    Springer
    Applied physics 50 (1990), S. 55-59 
    Details
    ISSN: 1432-0649
    Keywords: 42.55.Gp ; 42.55.Rz
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Nonlinear processes in UV optical materials were investigated by using 280-fs, 248-nm pulses. Nonlinear absorption in CaF2 was confirmed to be a two-photon process by using the luminescence of self-trapped excitons, which was also used for the single shot pulse width measurement. The absorption bands due to F centers were identified in CaF2, MgF2, and LiF after several hundred shots at 100 GW/cm2. Absorption at 248 nm was considerable especially in MgF2 and LiF. Self-focusing and self-phase modulation were observed in CaF2.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00330094
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 10
    Electronic Resource
    Electronic Resource
    Gas density measurement of pulsed gas jets using XeF four-photon fluorescence induced by a KrF laser (1992)
    Springer
    Applied physics 55 (1992), S. 323-326 
    Details
    ISSN: 1432-0649
    Keywords: 34.00 ; 42.55.Gp
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The gas densities of two pulsed gas jets were measured together with spatial and temporal distributions by the XeF fluorescence induced by a KrF laser. The B-X and C-A transitions of XeF showed a biquadratic dependence on laser intensity when SF6 was used as the F donor instead of F2, and quadratic and cubic dependences on gas density, respectively.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00333074
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...