Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
59 (1991), S. 2180-2182
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
High-quality epitaxial Y1B2Cu3Ox thin films (Tc,o ≥ (R18) 90 K, jc (77 K)≥ (R18)3 ×106A/cm2) were in situ grown on MgO by KrF excimer laser ablation. The combination of in situ resistance measurements, x-ray diffraction experiments, Tc measurements, scanning electron microscopy and scanning tunneling microscopy gives clear indications for an island growth on these substrates and shows growth steps and spirals at the film surface.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.106066
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