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  • American Institute of Physics (AIP)  (2)
  • 1995-1999  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    A calibration method of a radio frequency magnetic probe (1999)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 70 (1999), S. 3774-3775 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We demonstrate a simple calibration method of a rf magnetic probe by utilizing a two port network analysis method. The sensitivity (V/G) of the probe is determined by measuring the scattering parameters of S11 and S21. The magnetic field generated by the Helmholtz coil is calculated from S11 and the probe sensitivity is obtained from S21. The measured probe sensitivity is 0.1–0.6 V/G in the frequency range of 1–15 MHz. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1149951
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  • 2
    Electronic Resource
    Electronic Resource
    Elliptical grain growth in the solid-phase crystallization of amorphous SrBi2Ta2O9 thin films (1999)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 74 (1999), S. 2933-2935 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: During the crystallization process of amorphous SrBi2Ta2O9 (SBT) thin films at 800 °C in a dry O2 ambient, we have found elliptical nuclei in the initial nucleation state. These elliptical grains are preferentially oriented to [110] direction in the [11¯0] direction of projection. Elliptical grain growth keeps [110] as increasing the annealing time at 800 °C. Transmission electron microscopy and selected-area electron diffraction pattern indicate that the origin of 〈110〉-oriented crystallization is due to the highest ionic packing (001) SBT plane which includes TaO6 octahedra and the nearest bonding direction of TaO6 octahedra in SBT plane is the 〈110〉 direction. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.123970
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