Publication Date:
2019-07-13
Description:
Static random access memory (SRAM) upset rates in field programmable gate arrays (FPGAs) from the Xilinx Virtex 2 family have been tested for radiation effects on configuration memory, block RAM and the power-on-reset (POR) and SelectMAP single event functional interrupts (SEFIs). Dynamic testing has shown the effectiveness and value of Triple Module Redundancy (TMR) and partial reconfiguration when used in conjunction. Continuing dynamic testing for more complex designs and other Virtex 2 capabilities (i.e., I/O standards, digital clock managers (DCM), etc.) is scheduled.
Keywords:
Electronics and Electrical Engineering
Type:
MAPLD Paper: P69
,
6th annual MAPLD International Conference; Sep 09, 2003 - Sep 11, 2003; Washington, DC; United States
Format:
text
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