Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
88 (2000), S. 7095-7098
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Carbon nitride thin films were deposited on iron buffer layers by pulsed laser deposition assisted with ion implantation. Two types of samples (A) and (B) were prepared with and without iron layers. Several techniques were used to study the properties of the samples. Scanning tunneling microscopy (STM) was used to observe the surface structures of the samples. The difference in their surface morphologies was studied. The STM measurements also provided the relation between tunneling current and bias voltage to study the local density of states of the sample surface by calculating (dI/dV)/(I/V). Three band edges were observed from the calculated curve. Measurements by Raman and Fourier transform infrared (FTIR) spectra were carried out to study the electronic properties of the samples. The Raman spectra showed the presence of triply bonded carbon nitride bonds (C(Triple Bond)N) in sample (A), while only single bonds were observed in sample (B) by FTIR spectra. The mechanical properties were studied by nanoindentation. Both hardness and bulk modulus of the thin films were measured. © 2000 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1323750
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