Publication Date:
2019-07-13
Description:
We present an overview update of the metrological approach to be employed for the segmented mirror fabrication for Constellation-X spectroscopy x-ray telescope. We compare results achieved to date with mission requirements. This is discussed in terms of inherent capability versus in-practice capability.
Keywords:
Optics
Type:
SPIE Conference: Optics and Photonics 2007; Aug 26, 2007 - Aug 30, 2007; San Diego, CA; United States
Format:
application/pdf
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