ALBERT

Notizen: The Z-pinch-driven hohlraum (ZPDH) [J. H. Hammer et al., Phys. Plasmas 6, 2129 (1999)] is a promising approach to high yield inertial confinement fusion currently being characterized in experiments on the Sandia Z accelerator [M. E. Cuneo et al., Phys. Plasmas 8, 2257 (2001)]. Simulations show that capsule radiation symmetry, a critical issue in ZPDH design, is governed primarily by hohlraum geometry, dual-pinch power balance, and pinch timing. In initial symmetry studies on Z without the benefit of a laser backlighter, highly-asymmetric pole-hot and equator-hot single Z-pinch hohlraum geometries were diagnosed using solid low density foam burnthrough spheres. These experiments demonstrated effective geometric control and prediction of polar flux symmetry at the level where details of the Z-pinch implosion and other higher order effects are not critical. Radiation flux symmetry achieved in Z double-pinch hohlraum configurations exceeds the measurement sensitivity of this self-backlit foam ball symmetry diagnostic. To diagnose radiation symmetry at the 2%–5% level attainable with present ZPDH designs, high-energy x rays produced by the recently-completed Z-Beamlet laser backlighter are being used for point-projection imaging of thin-wall implosion and symmetry capsules. © 2002 American Institute of Physics.

Notizen: In this article we investigate the partial closure of diagnostic holes in Z-pinch driven hohlraums. These hohlraums differ from current laser-driven hohlraums in a number of ways such as their larger size, greater x-ray drive energy, and lower temperature. Although the diameter of the diagnostic holes on these Z-pinch driven hohlraums can be much greater than their laser-driven counterparts, 4 mm in diameter or larger, radiation impinges on the wall material surrounding the hole for the duration of the Z pinch, nearly 100 ns. This incident radiation causes plasma to ablate from the hohlraum walls surrounding the diagnostic hole and partially obscure this diagnostic hole. This partial obscuration reduces the effective area over which diagnostics view the hohlraum's radiation. This reduction in area can lead to an underestimation of the wall temperature when nonimaging diagnostics such as x-ray diodes and bolometers are used to determine power and later to infer a wall temperature. In this article we describe the techniques used to characterize the hole-closure in these hohlraums and present the experimental measurements of this process. © 2000 American Institute of Physics.

Notizen: The 100 ns, 20 MA pinch-driver Z is surrounded by an extensive set of diagnostics. There are nine radial lines of sight set at 12° above horizontal and each of these may be equipped with up to five diagnostic ports. Instruments routinely fielded viewing the pinch from the side with these ports include x-ray diode arrays, photoconducting detector arrays, bolometers, transmission grating spectrometers, time-resolved x-ray pinhole cameras, x-ray crystal spectrometers, calorimeters, silicon photodiodes, and neutron detectors. A diagnostic package fielded on axis for viewing internal pinch radiation consists of nine lines of sight. This package accommodates virtually the same diagnostics as the radial ports. Other diagnostics not fielded on the axial or radial ports include current B-dot monitors, filtered x-ray scintillators coupled by fiber optics to streak cameras, streaked visible spectroscopy, velocity interferometric system for any reflector, bremsstrahlung cameras, and active shock breakout measurement of hohlraum temperature. The data acquisition system is capable of recording up to 500 channels and the data from each shot is available on the Internet. A major new diagnostic presently under construction is the BEAMLET backlighter. We will briefly describe each of these diagnostics and present some of the highest-quality data from them. © 2001 American Institute of Physics.

Notizen: Three x-ray spectrometers, each with a transmission grating dispersion element, are routinely used at the Z soft x-ray facility to measure the spectrum and temporal history of the absolute soft x-ray power emitted from z-pinch and hohlraum radiation sources. Our goal is to make these measurements within an accuracy of ±10%. We periodically characterize the efficiency of the gratings used in the spectrometers by using an electron-impact soft x-ray source, a monochromator, grazing-incidence mirrors, thin filters, and an x-ray charge-coupled device (CCD) detector. We measure the transmission efficiency of the gratings at many photon energies for several grating orders. For each grating, we calculate efficiency as a function of photon energy using published optical constants of gold and multiple-slit Fraunhofer diffraction theory and fit the calculation to the measurements using the physical parameters of the grating as variables. This article describes the measurement apparatus and calibration techniques, discusses the grating efficiency calculation and fitting procedure, and presents recent results.

Notizen: X-ray powers on the order of 10 TW over an area of 4.5 mm2 are produced in the axial direction from the compression of a low-density foam target centered within a z-pinch on the Z generator.1 The x rays from this source are used for high-energy–density physics experiments, including the heating of hohlraums for inertial confinements fusion studies.2 In this article, detailed characteristics of this radiation source measured using an upgraded axial-radiation-diagnostic suite3 together with other on- and off-axis diagnostics are summarized and discussed in terms of Eulerian and Lagrangian radiation–magnetohydrodynamic code simulations. The source, characterized here, employs a nested array of 10-mm-long tungsten wires, at radii of 20 and 10 mm, having a total masses of 2 and 1 mg, and wire numbers of 240 and 120, respectively. The target is a 14 mg/cc CH2 foam cylinder of 5 mm diameter. The codes take into account the development of the Rayleigh–Taylor instability in the r–z plane, and provide integrated calculations of the implosion together with the x-ray generation. The radiation exiting the imploding target through the 4.5 mm2 aperture is measured primarily by the axial diagnostic suite that now includes diagnostics at an angle of ∼30° to the z axis. The near on-axis diagnostics include: (1) a seven-element filtered silicon-diode array,4 (2) a five-element filtered x-ray diffraction (XRD) array,5 (3) a six-element filtered PCD array,6 (4) a three-element bolometer,7 (5) time-resolved and time-integrating crystal spectrometers, and (6) two fast-framing x-ray pinhole cameras having 11 frames each. The filtered silicon diodes, XRDs, and PCDs are sensitive to 1–200, 140–2300, and 1000–4000 eV x rays, respectively. They (1) establish the magnitude of the prepluse generated during the run in of the imploding wire arrays, (2) measure the Planckian nature of the dominant thermal, and (3) nonthermal component of the emission. The bolometers and XRDs mounted on the near-normal and 30° LOS (line-of-sight) measure the total power and check the Lambertian nature of the emission. Additionally, a suite of filtered fast-framing x-ray pinhole cameras and silicon-diode arrays behind a transmission grating, mounted on LOSs nearly normal to the z axis, quantify the plasma plume exiting the aperture. The hard bremsstrahlung generated is estimated with both on- and off-axis shielded scintillator photomultiplier diagnostics. © 2001 American Institute of Physics.

Notizen: Measurements of the hohlraum wall temperature in Z-pinch driven hohlraum experiments require looking through small (2–4 mm diameter) diagnostic holes that undergo some degree of hole closure. The existing soft x-ray diagnostics on Z measure the total flux exiting this diagnostic hole and are therefore affected by this hole closure. To avoid having to measure the effective diagnostic hole area we have designed and constructed an imaging diode array (IDA) that incorporates pinhole imaging and an array of filtered silicon diodes to measure the absolute x-ray intensity from a spatially resolved region of a target. The instrument uses silicon diodes with subnanosecond time response that are sensitive to soft x rays in the range 100–3000 eV. An image of the target area is projected onto the silicon diodes using pinholes. Between each pinhole and it's respective diode is a soft x-ray filter. The material and thickness of the filter are selected to allow unfolding of spectral information in the 100–3000 eV spectral region. We plan to insert a set of grazing-incidence mirrors between each of the filter/diode pairs in a future version of this instrument to better define the spectral bandpass of each diode channel. Radiation from the target region is monitored by a gated microchannel-plate-intensified image recording device that is located immediately behind the diode array. A small shadow in the recorded image corresponds to the specific area of the target that is imaged onto each silicon diode. We are presently fielding this instrument in experiments on the Z facility located at Sandia National Laboratories in Albuquerque, NM. The instrument is located on the same line-of-sight and measures the same spatial region as a filtered fast-framing x-ray pinhole camera and a transmission grating spectrometer. This article describes the design of the IDA diagnostic and presents the results of measurements obtained in hohlraum experiments conducted on Z. © 2001 American Institute of Physics.

Notizen: Using standard multilayer and effective medium models, we determine microstructures that optimize the near-IR-visible normal-incidence optical transmittance of electrically conducting metal films intended for use as semitransparent contacts for semiconductor devices such as photodetectors or photoelectrochemical converters. Various conditions are considered, including unpolarized and linearly polarized light and electrical conduction both parallel and perpendicular to the surface. For linearly polarized light, the optimum microstructure consists of parallel metal lines of nominally square cross section oriented perpendicular to the polarization vector of the incident light, regardless of the direction of electrical conduction. The line separation and cross-sectional dimensions must both be small compared to the wavelength λ. For unpolarized radiation, the optimum microstructure depends on the direction of electrical conduction. For conduction parallel to the surface, the optimum microstructure again consists of parallel lines with the lines oriented perpendicular to the residual linear polarization, if any, of the incident flux. For conduction perpendicular to the surface, the optimum microstructure consists of cylindrical metal posts of dimension small compared to λ. Expressions are derived that allow the thicknesses and refractive indices of protective antireflection coatings to be calculated to first order in the thicknesses of the metal films. The more general case of antireflection coatings for anisotropic structures is briefly discussed.