Publication Date:
2014-01-28
Description:
Author(s): R. A. L. Almeida, S. O. Ferreira, T. J. Oliveira, and F. D. A. Aarão Reis Scaling of surface fluctuations of polycrystalline CdTe/Si(100) films grown by hot-wall epitaxy are studied. The growth exponent of surface roughness and the dynamic exponent of the autocorrelation function in the mound growth regime agree with the values of the Kardar-Parisi-Zhang (KPZ) class. The ... [Phys. Rev. B 89, 045309] Published Mon Jan 27, 2014
Keywords:
Semiconductors II: surfaces, interfaces, microstructures, and related topics
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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