Electronic Resource
Copenhagen
:
International Union of Crystallography (IUCr)
Applied crystallography online
33 (2000), S. 1335-1341
ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
Nanometre-sized particles are of considerable current interest because of their special size-dependent physical properties. Debye–Scherrer diffraction patterns are often used to characterize samples, as well as to probe the structure of nanoparticles. Unfortunately, the well known `Scherrer formula' is unreliable at estimating particle size, because the assumption of an underlying crystal structure (translational symmetry) is often invalid. A simple approach is presented here which takes the Fourier transform of a Debye–Scherrer diffraction pattern. The method works well on noisy data and when only a narrow range of scattering angles is available.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889800010888
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