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  • 1
    facet.materialart.
    Unknown
    Dresden
    Associated volumes
    Call number: K 95.0066 ; K 95.0067
    In: Geologische Karte
    Pages: 1 Kt. + Erl.-H. (52 S.)
    Edition: unveränd. Nachdr., 1995
    Branch Library: GFZ Library
    Branch Library: GFZ Library
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  • 2
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Biochemistry 25 (1986), S. 6479-6486 
    ISSN: 1520-4995
    Source: ACS Legacy Archives
    Topics: Biology , Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 60 (1986), S. 3558-3566 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The study of the excess conductivity induced in a material by pulsed optical excitation yields information on the optoelectronic properties of the material and is receiving increasing attention. As conventional conductivity techniques are hampered by the need to apply electrical contacts, we have investigated the reliability and the possibilities of microwave conductivity measurements. This paper first presents the general background for excess conductivity measurements in the microwave range, and then derives the quantitative relationship between the reflected microwave signal and the change in conductivity for a wafer of single-crystalline Si. For this sample, the theory of excess charge carrier kinetics is also developed. After a short description of our apparatus, kinetic measurements on a nano- and microsecond timescale are compared to theory.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 60 (1986), S. 3150-3156 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The interactions of the reactive metals Al and In with both cleaved and sputtered p-type Hg1−xCdxTe surfaces have been investigated using synchrotron radiation-induced ultraviolet photoelectron spectroscopy. The sputtered surfaces are depleted of a fraction of their Hg (∼25% and ∼40% for x=0.21 and x=0.28 material, respectively, relative to the Hg found on the corresponding cleaved surfaces) and are more inverted than the cleaved surfaces with the Fermi level higher in the conduction band. During metal deposition, the cleaved and sputtered surfaces behave similarly: in the initial stages, the metal reacts with the HgTe alloy component to form a metal telluride and Hg, which leaves the surface region. At the same time, the inverted surface becomes more degenerate. After the metal has reacted with all the available HgTe within a certain surface region, an unreacted metallic film grows on the surface. Such identical behavior of the two types of surfaces is explained by the large difference in thermodynamic stability between HgTe and the metal tellurides.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 60 (1986), S. 3157-3161 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The interaction between thin layers of Au and both cleaved and sputtered p-type Hg0.72Cd0.28Te and sputtered p-type Hg0.79Cd0.21Te surfaces has been investigated with ultraviolet photoelectron spectroscopy using synchrotron radiation. Only a small loss of Hg from the interface was observed during Au deposition, in contrast to that seen during Al and In deposition reported elsewhere. The retention of Hg is explained by the lower stability of AuTe2 compared with HgTe, which makes the exchange reaction between Au and Hg unfavorable. Small differences in the Hg/Cd ratio following Au deposition with different surface preparations and material were noted. They were attributed to reduced stability of the ion-bombarded surface caused by sputter-induced defects and reduced strength of the Hg–Te bond, which resulted from the increased local CdTe concentration. Although Au diffused into the semiconductor to partially compensate for the cleavage-induced defects (which act as donors), it was not able to compensate appreciably for the larger number of sputter-induced defects.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 84 (1986), S. 5344-5350 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Field-dependent attachment of quasifree electrons to carbon tetrachloride, CCl4, and ethyl bromide, EtBr, was observed in liquid tetramethylsilane (TMS) at 21 °C using a picosecond-pulse-conductivity technique. The field dependences of the electron-attachment rate constants, ke's, of the two solutes, were measured at electric fields between 15 and 200 kV/cm and were found to parallel the energy dependences of the electron-attachment rates of the two scavengers in the gas phase; i.e., electron attachment to CCl4 decreases with increasing field (energy) whereas electron attachment to EtBr increases with increasing field (energy). The observed field dependence of the ke's is interpreted as being consistent with electron heating by the field, and we estimate that a field of 150 kV/cm increases the energy of an electron in TMS at 21 °C to ∼0.1 eV. The effects of thermalizing third bodies on the field dependences of the ke's are also discussed.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 84 (1986), S. 2783-2794 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Simulations by molecular dynamics of 13-particle clusters of argon display distinct nonrigid, liquid-like and near-rigid, solid-like "phases.'' The simulations, conducted at constant total energy, display a low-energy region in which only the solid-like form appears, a high-energy region in which only the liquid-like form appears, and an intermediate band of energy—a "coexistence region''— in which clusters exhibit both forms. The intervals of time spent in each phase in the two-form coexistence region are long compared with the intervals required to establish equilibrium-like properties distinctive of each form, such as mean square displacement and power spectrum, so that well-defined phases can be said to exist. The fraction of time spent in each phase is a function of the energy. When a long simulation is separated into regions of solid-like and liquid-like behavior, the curve of the derived caloric equation of state is double valued in the two-phase range of energy, forming two well-defined, smooth branches. When, instead, the caloric curve is constructed from averages over all of a long run, its form is smooth and monotonic showing no trace of the "loop'' that had been reported for earlier treatments with much shorter molecular dynamics runs, and which we could also reproduce with short runs.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 57 (1986), S. 197-201 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Conventional laser scanning techniques for the topological characterization of photoactive materials and devices are hampered by the need to apply electrical contacts. We present a technique to overcome this limitation using the relative change of reflected microwave power to probe the conductivity locally induced in the sample. After a discussion of the theoretical background and the limitations of the method the apparatus is described. Application to scan the surface of a semiconductor chip carrying an electrode structure is used to discuss the resolution and linearity.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Journal of the American Chemical Society 108 (1986), S. 4018-4022 
    ISSN: 1520-5126
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 10
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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