Publication Date:
2016-06-07
Description:
Methods of destructive physical analysis (DPA) are suggested which might have more usefulness if the procedures followed lines of accelerated testing. A brief presentation of DPA procedures is followed by a discussion of their value.
Keywords:
ELECTRONICS AND ELECTRICAL ENGINEERING
Type:
NASA. Marshall Space Flight Center Capacitor Technol., Appl. and Reliability; p 125-129
Format:
text
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