Publication Date:
2014-08-01
Description:
Author(s): J. Bertinshaw, S. Brück, D. Lott, H. Fritzsche, Y. Khaydukov, O. Soltwedel, T. Keller, E. Goering, P. Audehm, D. L. Cortie, W. D. Hutchison, Q. M. Ramasse, M. Arredondo, R. Maran, V. Nagarajan, F. Klose, and C. Ulrich Depth-sensitive magnetic, structural, and chemical characterization is important in the understanding and optimization of physical phenomena emerging at the interfaces of transition metal oxide heterostructures. In a simultaneous approach we have used polarized neutron and resonant x-ray reflectomet... [Phys. Rev. B 90, 041113] Published Thu Jul 31, 2014
Keywords:
Electronic structure and strongly correlated systems
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
Permalink