Depth-sensitive magnetic, structural, and chemical characterization is important in the understanding and optimization of physical phenomena emerging at the interfaces of transition metal oxide heterostructures. In a simultaneous approach we have used polarized neutron and resonant x-ray reflectometry to determine the magnetic profile across atomically sharp interfaces of ferromagnetic ${\mathrm{La}}_{0.67}{\mathrm{Sr}}_{0.33}{\mathrm{MnO}}_3$/multiferroic ${\mathrm{BiFeO}}_3$ bilayers with subnanometer resolution. In particular, the x-ray resonant magnetic reflectivity measurements at the Fe and Mn resonance edges allowed us to determine the element-specific depth profile of the ferromagnetic moments in both the ${\mathrm{La}}_{0.67}{\mathrm{Sr}}_{0.33}{\mathrm{MnO}}_3$ and ${\mathrm{BiFeO}}_3$ layers. Our measurements indicate a magnetically diluted interface layer within the ${\mathrm{La}}_{0.67}{\mathrm{Sr}}_{0.33}{\mathrm{MnO}}_3$ layer, in contrast to previous observations on inversely deposited layers [P. Yu et al., Phys. Rev. Lett. 105, 027201 (2010)]. Additional resonant x-ray reflection measurements indicate a region of altered Mn and O content at the interface, with a thickness matching that of the magnetic diluted layer, as the origin of the reduction of the magnetic moment.

• Received 1 July 2013
• Revised 11 July 2014

DOI:https://doi.org/10.1103/PhysRevB.90.041113