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  • Articles  (8,215)
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  • 1
    Electronic Resource
    Electronic Resource
    Structure and Mechanical Properties of Mg-Zn-RE System Alloys (2007)
    s.l. ; Stafa-Zurich, Switzerland
    Materials science forum Vol. 561-565 (Oct. 2007), p. 199-202 
    Details
    ISSN: 1662-9752
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: The lightest density of Mg has stimulated renewed interest in Mg based alloys forapplications in the automotive, aerospace and communications industries. However, Mg in the pureform has relatively low strength, limited ductility and is susceptible to corrosion. Great efforts havebeen made to improve the mechanical properties of Mg alloys. Alloying Mg with other elements isone of the most important methods. An important class of Mg alloys is the Mg-Zn-RE system (RE =rare earth elements). In recent few decades, a series of new Mg-Zn-RE system alloys have beenobtained, and detailed the structure and mechanical properties of the alloys. In this paper, the structureand mechanical properties of the Mg-Zn-RE alloys have been summarized. It showed that these alloyshave high strength and they are prospected to be widely used in the future
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/17/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.561-565.199.pdf
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  • 2
    Electronic Resource
    Electronic Resource
    Nonlinear behavior of magnetic surface waves on the interface between ferromagnet and antiferromagnet (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 1908-1913 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In this article the nonlinear frequency characteristics of the transverse magnetic surface waves at microwave frequencies on the interface between a ferromagnet and an antiferromagnet have been studied. The results show that the magnetic surface waves have passband(s) and stopband(s), which are interchangeable through the variation of the wave power. It is shown that the nonlinear surface waves excited on the interface can be backward surface waves with group velocities opposite to their phase velocities in direction. The passband widths of the forward surface waves are about five times larger than those of the backward surface waves in the situation. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.372111
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  • 3
    Electronic Resource
    Electronic Resource
    Slip sliding away: A novel head–disk interface and its tribology (invited) (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 5383-5388 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The continuous reduction of head–disk spacing has made the use of supersmooth media a necessity in gaining ultrahigh magnetic recording areal density. To overcome the stiction barrier associated with supersmooth disks without compromising the head flyability requirement, texture features can be transferred from the disk surface to the slider surface, creating a new type of head–disk interface, the padded slider interface. The tribology of a padded slider interface is in many ways different from that of the traditional head–disk interface with texture on the disk only. In this article, various unique tribological aspects of the padded slider interface are discussed in detail. Both theoretical modeling results and experimental data are presented to elucidate the stiction, friction, and wear behaviors of this novel head–disk interface. It is shown that the padded slider technology offers a viable alternative to the ramp load technology as a head–disk interface solution for the ultrahigh areal density. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.373352
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  • 4
    Electronic Resource
    Electronic Resource
    A study of dynamic friction at the head–disk interface (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 6152-6154 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: With its precisely controlled contact geometry, the head–disk interface with laser zone texture affords a model system for the study of dynamic friction. By using two types of head sliders, i.e., the conventional slider and the padded slider, and a matrix of hard disks with a wide range of laser zone texture parameters, head–disk contacts involving a small number as well as a large number of bumps are realized. A rich variety of dynamic friction behavior is observed with respect to bump height and bump density dependence. A satisfactory explanation of these friction behaviors requires that both the deformational component and the adhesive component of friction be considered on equal footings. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.372639
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  • 5
    Electronic Resource
    Electronic Resource
    Optimized compact secondary electron collector with 100% collection efficiency for focused ion beam systems (1998)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 69 (1998), S. 91-94 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: This article describes the optimization procedure to design a compact scintillator which has a maximum secondary electron collection efficiency without the need of a bias voltage for a focused ion beam (FIB) system. The optimized scintillator design was proven to be very effective for focused ion beam systems. By doing design optimization theoretically and experimentally, a 100% collection was realized for a simple, compact and robust scintillator structure without the bias voltage. So far our experimental study is within the scope of FIB imaging, but we have reasons to believe that the optimized designs or the optimization methodology discussed in this article should be useful in other charged particle applications such as scanning electron microscopy or wherever a scintillator is used to collect secondary electrons. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1148483
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  • 6
    Electronic Resource
    Electronic Resource
    Probing nanodefects in fused silica by near-field scanning optical microscopy (1998)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 84 (1998), S. 3016-3019 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Nanodefects were artificially introduced into a fused silica surface by nanoindenting with a commercial atomic force microscope. The sample was illuminated in a total internal reflection configuration and evanescent waves were detected by a near-field scanning optical probe in the constant tip-sample separation mode. The observed contrast in optical images was attributed to the strain fields associated with the nanoindents. Thus the optical image directly maps out the strain distributions associated with these nanoindents. Optical images were taken at different polarizations of the incident light (s and p). Due to different field distributions near the sample surface for the two polarizations, strain distributions at different depths were probed. The spatial resolution of this technique was limited by the probe aperture size and detector sensitivity. This technique may be a useful tool to study laser-induced damage mechanisms in optical materials at the submicron scale.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.368454
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  • 7
    Electronic Resource
    Electronic Resource
    Direct measurement of refractive-index dispersion using a time-delayed technique (1998)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 69 (1998), S. 1472-1475 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe a new way to measure the refractive index of dielectric materials using a time-resolved correlation method. By measuring the time delay of femtosecond pulse trains through a dielectric material, we obtain the refractive index of the material. This technique is direct, less surface sensitive, and precise to four digits. Consequently, it gives a true bulk index value. We apply this technique to measure the refractive index of fused silica, InP, and GaAs in the near infrared spectral regime. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1148794
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  • 8
    Electronic Resource
    Electronic Resource
    Effect of alcohol washing and autoclaving on nucleotides of soybean meal (1969)
    s.l. : American Chemical Society
    Journal of agricultural and food chemistry 17 (1969), S. 335-340 
    Details
    ISSN: 1520-5118
    Source: ACS Legacy Archives
    Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, Nutrition , Process Engineering, Biotechnology, Nutrition Technology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/jf60162a008
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  • 9
    Electronic Resource
    Electronic Resource
    S-H Bond Activation in H2S and Thiols by[RhMn(CO)4(Ph2PCH2PPh2)2]. Compounds Containing Terminal or Bridging Sulfhydryl and Thiolato Groups (1994)
    s.l. : American Chemical Society
    Inorganic chemistry 33 (1994), S. 3735-3744 
    Details
    ISSN: 1520-510X
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/ic00095a017
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  • 10
    Electronic Resource
    Electronic Resource
    Resolution limits from charge transport in optically addressed spatial light modulators (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 6923-6935 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Spatial resolution of optically addressed spatial light modulators (OASLMs) is degraded by several different transfer processes in these devices. We have developed a general transient charge transport model to calculate and simulate the resolution limits of OASLMs due to the following charge spreading mechanisms during the transfer process in which the input image is converted into a particular charge distribution in the photosensor layer. (i) The effect of charge drift in the photosensor bulk on resolution increases with the thickness of the photosensor and the light-modulating layers. It also increases with the total amount of photogenerated charge collected at the interface. (ii) The effect of charge diffusion in the photosensor bulk on resolution is largely independent of the carrier mobility in the semiconductor photosensor. In most cases the corresponding spatial frequency f50% is proportional to (square root of)Vsc/dsc, where dsc is the photosensor thickness and Vsc is the voltage drop in that layer. To have high-sensitivity OASLMs the transit time of charge carriers from the photosensor bulk to the interface must be much shorter than the recombination lifetime. (iii) The effects that charge drift, diffusion, and trapping at the photosensor-light-modulating layer interface have on resolution depend strongly on the interface properties. Decreasing the mobility or the trapping time of charge carriers at the interface can dramatically improve the resolution of OASLMs. The resolution ranges from 3 to 875 line pairs/mm for respective diffusion lengths of 10 to 0.1 μm at the interface. The combined effect on resolution from each of the charge spreading and other resolution-degrading mechanisms is also discussed. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.360459
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