ALBERT

All Library Books, journals and Electronic Records Telegrafenberg

feed icon rss

Ihre E-Mail wurde erfolgreich gesendet. Bitte prüfen Sie Ihren Maileingang.

Leider ist ein Fehler beim E-Mail-Versand aufgetreten. Bitte versuchen Sie es erneut.

Vorgang fortführen?

Exportieren
Filter
  • Electron states in low-dimensional structures (superlattices, quantum well-structures and multilayers)  (1)
Sammlung
Schlagwörter
Verlag/Herausgeber
Erscheinungszeitraum
  • 1
    Digitale Medien
    Digitale Medien
    Springer
    Il nuovo cimento della Società Italiana di Fisica 18 (1996), S. 1213-1223 
    ISSN: 0392-6737
    Schlagwort(e): Optoelectronic devices ; Other solid inorganic materials ; Electron states in low-dimensional structures (superlattices, quantum well-structures and multilayers) ; Quantum optics ; Conference proceedings
    Quelle: Springer Online Journal Archives 1860-2000
    Thema: Physik
    Notizen: Summary The properties and preliminar applications of porous-silicon (p-Si) microcavities are here reported. These structures are based on a planar resonator formed by two narrow-band high-reflectance distributed Bragg reflectors separated by a thin active optical layer, all of which are made of p-Si layers. The accurate control of the electrochemical dissolution of Si lets us realize p-Si multilayers with the desired refractive indices sequence. Large improvements of the emission properties of p-Si microcavities with respect to standard p-Si samples are observed: 1) increased emission intensity, 2) spectral narrowing of the emission band, and 3) high directionality in the emission pattern. Resonant-cavity light-emitting diodes with higher efficiencies and stabilities with respect to standard p-Si/metal devices are demonstrated. Reflectivity changes due to absorption saturation have been observed.
    Materialart: Digitale Medien
    Standort Signatur Erwartet Verfügbarkeit
    BibTip Andere fanden auch interessant ...
Schließen ⊗
Diese Webseite nutzt Cookies und das Analyse-Tool Matomo. Weitere Informationen finden Sie hier...