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  • 1
    Electronic Resource
    Electronic Resource
    Monoacylsulfuric acids as intermediates for .alpha.-halogenation of aliphatic acids (1982)
    s.l. : American Chemical Society
    The @journal of organic chemistry 47 (1982), S. 1182-1184 
    Details
    ISSN: 1520-6904
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/jo00346a007
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  • 2
    Electronic Resource
    Electronic Resource
    A queueing model of a production system with two machines, one operator and priorities (1989)
    Springer
    Queueing systems 4 (1989), S. 339-349 
    Details
    ISSN: 1572-9443
    Keywords: Machining time ; handwork time ; overlapping service time ; Markov chain ; equilibrium equations ; nonsaturation condition ; waiting time
    Source: Springer Online Journal Archives 1860-2000
    Topics: Computer Science
    Notes: Abstract This paper studies a priority queueing model of a production system in which one operator serves two types of units with overlapping service times. The two types of units arrive in independent Poisson processes. There are two machines in the system. Units of type 1 receive two consecutive types of services at machine #1: the handwork performed by the operator and the automatic machining without the operator. Units of type 2 receive only the handwork performed by the operator at machine #2. The operator attends the two machines according to a strict-priority discipline which always gives units of type 2 higher priority than units of type 1. At each machine the handwork times have a general distribution, and at machine #1 the machining times have an exponential distribution. The Laplace-Stieltjes transform of the queue-size distributions and the waiting time distributions for a stationary process are obtained.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01159472
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  • 3
    Electronic Resource
    Electronic Resource
    Application of ion beam sputtering for high-resolution electron microscopy (1986)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 4 (1986), S. 1-19 
    Details
    ISSN: 0741-0581
    Keywords: Ion beam sputtering ; Sputtering yield ; Etching ; Thinning ; High-resolution electron microscopy ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: Ion beam sputtering for high-resolution electron microscopy has basically provided miscellaneous operational features such as atomic shadowing, uncoated observation, and etching of biological specimens coupled with tungsten sputter coating and thinning of solid materials.Based on the power-potential law of Lindhard for ionic impact phenomena on metal surfaces, the universal yield-energy relationship has been derived. Thereby the sputtering deposition rate with reference to the sputtering removal rate was obtained as a function of sputtering yield, and the most important angular distribution of sputtering yield could be measured by using the hemicylindrical specimen stage.Evidence is presented to show that ion beam sputtering has become one of the most powerful tools for high-resolution electron microscopy.
    Additional Material: 14 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060040102
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  • 4
    Electronic Resource
    Electronic Resource
    Measurement of electron probe beam diameter by digital image processing (1985)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 2 (1985), S. 463-469 
    Details
    ISSN: 0741-0581
    Keywords: Electron probe beam diameter ; Digital image processing ; Acutance ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: The present report illustrates a computerized method for precise measurement of the diameter of an electron beam. The value of this measurement extends beyond simply providing an accurate estimate of resolution. Other salient areas which will benefit include quantitative X-ray microanalysis, energy loss spectroscopy, diffraction studies, and electron beam lithography. The biological sciences as well as the material sciences will gain enormously from improved accuracy in measurement (control) of beam diameter. It is anticipated that most or all of the mathematical manipulations outlined in this paper will be incorporated into digital electronic packages which will perform the functions automatically for setting the electron beam diameter to the scientist's choice. The purpose of the present report is to indicate some of the principles involved so that as electron microscopy becomes more computerized and automated, the user will have some understanding of what the electronics are doing rather than simply depressing a button or two and ignoring the power of what resides within the walls of the instrument.The performance of a scanning electron microscope (SEM) and a scanning transmission electron microscope (STEM) is roughly determined by the incident electron probe beam size (diameter) involving a sufficient electron current. In the present paper, the diameter of an ultrafine electron beam is measured indirectly from the information given by the blurring of an edge in a STEM or a SEM image of a crystalline specimen with fine, sharp edges. The obtained data were processed by digital image processing methods which give an accurate value of the beam diameter. For confirming the validity of this method, a suitable simulation based on the convolution theorem was performed. By using this measurement, we could measure the diameter of an ultrafine electron beam down to 2 nm, which could not be measured easily by previous techniques.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060020508
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  • 5
    Electronic Resource
    Electronic Resource
    The conversion of a field-emission scanning electron microscope to a high-resolution, high-performance scanning transmission electron microscope, while maintaining original functions (1987)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 6 (1987), S. 15-30 
    Details
    ISSN: 0741-0581
    Keywords: STEM ; On-line computer system ; Digital image processing ; Unstained biological specimen ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: Recently, the reliability of field-emission electron guns has increased. In addition, the cost of computer systems for on-line processing has dropped. Hence, we should now consider the use of scanning transmission electron microscopy (STEM) for routine work, especially, in the field of biology where one may expect to utilize digital image processing techniques.An STEM has been constructed, without disturbing the original functions, by converting a commercial scanning electron microscope equipped with a fieldemission gun. The STEM is generally operated at accelerating voltage 30 kV, focal length 7.5 mm, and beam current 1-2 × 10-10 A. Several improvements have been incorporated for removing the effects of vibration, contamination, and stray magnetic fields. Also, an adjustable detector aperture was utilized. The modified instrument was connected to an on-line digital image processing system for utilizing the information obtained from STEM images. The advantages of the modified system were studied from various viewpoints.
    Additional Material: 14 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060060104
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  • 6
    Electronic Resource
    Electronic Resource
    Automatic measurement of scanning beam diameter using an on-line digital computer (1986)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 3 (1986), S. 159-167 
    Details
    ISSN: 0741-0581
    Keywords: Electron probe beam diameter ; Digital image processing ; Online digital computer ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: A method for the measurement of electron probe beam diameter by digital image processing has recently been published. The purpose of the present report is to describe the development of an automatic system for beam diameter measurement. To complete this system, a method based on a theory which combines automation and high-resolution conditions is proposed. In practice, the beam diameter is measured from the STEM image of a crystalline hole in a gold thin film, utilizing an on-line computer system equipped with newly developed digital processing programs linked to a SEM in the transmission mode. The functions of the programs include statistical processing, matching, noise removal, interpolation, selection, and rotation. By combining these functions, the scanning beam diameter is accurately measured, in spite of difficulties, under most electron microscope operating conditions. The user simply appoints the edge included in the STEM image.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060030204
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  • 7
    Electronic Resource
    Electronic Resource
    An inexpensive and highly efficient device for observing a transmitted electron image in SEM (1987)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 5 (1987), S. 51-58 
    Details
    ISSN: 0741-0581
    Keywords: STEM image ; SE yield ; Digital image processing ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: An inexpensive, efficient device that supplies a transmission mode to the conventional SEM has been developed. The transmitted electrons strike a metal plate, and these generate secondary electrons that are proportional to the quantity of the transmitted electrons. The generated electrons are collected by the secondary electron detector. Hence, the performance of this device is influenced by the number of secondary electrons generated in the metal plate. In order to construct a device that can attain the best transmitted electron image, the signal-to-noise ratio of images, obtained from various trial devices, were measured by a newly-developed digital image processing program. When the material and shape of the device are selected, to produce high-secondary emission, the efficiency of the device compares with that of a relatively expensive standard detector system (scintillator detector).
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060050105
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  • 8
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    Nanocrystallization of Zr-Cu-Ni-Al-Au glassy alloys during severe plastic deformation (2014)
    Institute of Physics (IOP)
    Details
    Publication Date: 2014-08-09
    Description: A study has been carried out into the formation of nanocrystalline grains during high-pressure torsion (HPT) deformation of Zr 65 Cu 17 Ni 5 Al 10 Au 3 bulk alloys prepared using tilt casting. As a preliminary to this, X-ray diffraction (XRD) and differential scanning calorimetry (DSC) analyses were carried out on as-cast Zr 65+ x Cu 17- x Ni 5 Al 10 Au 3 ( x =0~5 at.%) and Zr 65 Cu 20 Ni 5 Al 10 Au 3 alloys, in order to determine the effect on the microstructure of the excess Zr content x and the presence of Au. From the XRD patterns, it was determined that all of the alloys had a metallic glassy nature. For Zr 65 Cu 17 Ni 5 Al 10 Au 3 , the DSC results indicated the presence of a wide supercooled liquid region between the glass transition temperature (T g ) of 644 ...
    Print ISSN: 1757-8981
    Electronic ISSN: 1757-899X
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Published by Institute of Physics (IOP)
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  • 9
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    High resolution shadowing for electron microscopy by sputter deposition (1976)
    Elsevier
    Details
    Publication Date: 1976-01-01
    Print ISSN: 0304-3991
    Electronic ISSN: 1879-2723
    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
    Published by Elsevier
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  • 10
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    LSSIG is a novel murine leukocyte-specific GPCR that is induced by the activation of STAT3 (2003)
    American Society of Hematology
    Details
    Publication Date: 2003-02-01
    Description: G-protein–coupled receptors (GPCRs) transduce the signal of a wide variety of chemokines, cytokines, neurotransmitters, hormones, odorants, and others to regulate the biologic homeostasis, including hematopoiesis and immunity. Here we report the molecular cloning of leukocyte-specific STAT-induced GPCR (LSSIG), which is a novel murine orphan GPCR with the highest homology to human GPR43. The mRNA expression of LSSIG was clearly induced in M1 leukemia cells during the leukemia inhibitory factor (LIF)–induced differentiation to macrophages, and the induction was evidently signal transducers and activators of transcription 3 (STAT3)–dependent. GPR43 expression was also strongly induced in HL-60 and U937 leukemia cells during the differentiation to monocytes. Further analysis showed that the expression of both LSSIG and GPR43 is highly restricted in hematopoietic tissues. Cytokine-stimulation induced LSSIG and GPR43 in bone marrow cells, and monocytes and neutrophils, respectively. These results suggest that LSSIG and GPR43 might play pivotal roles in differentiation and immune response of monocytes and granulocytes.
    Print ISSN: 0006-4971
    Electronic ISSN: 1528-0020
    Topics: Biology , Medicine
    Published by American Society of Hematology
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