Publication Date:
2015-08-15
Description:
Author(s): Luis G. G. V. Dias da Silva and Rogério de Sousa Magnetic and charge noise have a common microscopic origin in solid-state devices, as described by a universal electron trap model. In spite of this common origin, magnetic (spin) and charge noise spectral densities display remarkably different behaviors when many-particle correlations are taken int… [Phys. Rev. B 92, 085123] Published Fri Aug 14, 2015
Keywords:
Electronic structure and strongly correlated systems
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics